Dr. Vladimir Kaganer

Senior Scientist

Vladimir Kaganer

Telefon: +49 30 20377 486

Raum: 0520

Email: kaganer@pdi-berlin.de

 

Abteilung: Microstructure

Core research areas: Nanoanalytics , III-V nanowires for optoelectronics

 

 

31 Autor V. S. Kopp , V. M. Kaganer , J. Schwarzkopf , F. Waidick , T. Remmele , A. Kwasniewski , M. Schmidbauer
Titel

X-ray diffraction from nonperiodic layered structures with correlations: analytical calculation and experiment on mixed Aurivillius films

Source Acta Cryst. A , 68 , 148 ( 2012 )
2257 Cite : Bibtex RIS
V. S. Kopp, V. M. Kaganer, J. Schwarzkopf, F. Waidick, T. Remmele, A. Kwasniewski, and M. Schmidbauer

32 Autor V. M. Kaganer , A. Yu. Belov
Titel

Strain and x-ray diffraction from axial nanowire heterostructures

Source Phys. Rev. B , 85 , 125402 ( 2012 )
Download: PDF | 2278 Cite : Bibtex RIS
V. M. Kaganer, and A. Yu. Belov

33 Autor Y. J. Cho , O. Brandt , M. Korytov , M. Albrecht , V. M. Kaganer , M. Ramsteiner , H. Riechert
Titel

Structural properties of InN films grown on O-face ZnO(000|1) by plasma-assisted molecular beam epitaxy

Source Appl. Phys. Lett. , 100 , 152105 ( 2012 )
Download: PDF | 2296 Cite : Bibtex RIS
Y. J. Cho, O. Brandt, M. Korytov, M. Albrecht, V. M. Kaganer, M. Ramsteiner, and H. Riechert

34 Autor V. S. Kopp , V. M. Kaganer , G. Capellini , M. De Seta , P. Zaumseil
Titel

X-ray diffraction study of plastic relaxation in Ge-rich SiGe virtual substrates

Source Phys. Rev. B , 85 , 245311 ( 2012 )
Download: PDF | 2319 Cite : Bibtex RIS
V. S. Kopp, V. M. Kaganer, G. Capellini, M. De Seta, and P. Zaumseil

35 Autor M. Wölz , V. M. Kaganer , O. Brandt , L. Geelhaar , H. Riechert
Titel

Erratum: “Analyzing the growth of InxGa1-xN/GaN superlattices in selfinduced GaN nanowires by x-ray diffraction” [Appl. Phys. Lett. 98, 261907 (2011)]

Source Appl. Phys. Lett. , 100 , 179902 ( 2012 )
Download: PDF | 2393 Cite : Bibtex RIS
M. Wölz, V. M. Kaganer, O. Brandt, L. Geelhaar, and H. Riechert

36 Autor V. M. Kaganer , K. K. Sabelfeld
Titel

Short range correlations of misfit dislocations in the x-ray diffraction peaks

Source Phys. Status Solidi A , 208 , 2563 ( 2011 )
2177 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld

37 Autor M. Wölz , V. M. Kaganer , O. Brandt , L. Geelhaar , H. Riechert
Titel

Analyzing the growth of InxGa1-xN/GaN superlattices in self-induced GaN nanowires by x-ray diffraction

Source Appl. Phys. Lett. , 98 , 261907 ( 2011 )
Download: PDF | 2208 Cite : Bibtex RIS
M. Wölz, V. M. Kaganer, O. Brandt, L. Geelhaar, and H. Riechert

38 Autor V. M. Kaganer , M. Wölz , O. Brandt , L. Geelhaar , H. Riechert
Titel

X-ray diffraction profiles from axial nanowire heterostructures

Source Phys. Rev. B , 83 , 245321 ( 2011 )
Download: PDF | 2211 Cite : Bibtex RIS
V. M. Kaganer, M. Wölz, O. Brandt, L. Geelhaar, and H. Riechert

39 Autor A. Benediktovitch , A. Ulyanenkov , F. Rinaldi , K. Saito , V. M. Kaganer
Titel

Concentration and relaxation depth profiles of InxGa1-xAs/GaAs and GaAs1-xPx/GaAs graded epitaxial films studied by x-ray diffraction

Source Phys. Rev. B , 84 , 035302 ( 2011 )
Download: PDF | 2233 Cite : Bibtex RIS
A. Benediktovitch, A. Ulyanenkov, F. Rinaldi, K. Saito, and V. M. Kaganer

40 Autor T. Watahiki , F. Grosse , V. M. Kaganer , A. Proessdorf , W. Braun
Titel

Growth and structural characterization of epitaxial (La1-xLux)2O3 layers grown on Si(111)

Source J. Vac. Sci. Technol. B , 28 , C3A5 ( 2010 )
2065 Cite : Bibtex RIS
T. Watahiki, F. Grosse, V. M. Kaganer, A. Proessdorf, and W. Braun