Dr. Vladimir Kaganer

X-ray diffraction peaks from correlated dislocations: Monte Carlo study of the dislocation screening

@article{ author = { V. M. Kaganer and K. K. Sabelfeld }, title = { X-ray diffraction peaks from correlated dislocations: Monte Carlo study of the dislocation screening }, journal = { Acta Crystallographica A }, volume = { 66 }, year = { 2010 }, pages = { 703 } }

TY - JOUR AU - V. M. Kaganer AU - K. K. Sabelfeld TI - X-ray diffraction peaks from correlated dislocations: Monte Carlo study of the dislocation screening JF - Acta Crystallographica A JA - Acta Cryst. A J1 - VL - 66 SP - 703 PY - 2010/01/01

Epitaxial growth and structure of (La_1-xLu_x)₂O₃ alloys on Si(111)

@article{ author = { T. Watahiki and F. Grosse and W. Braun and V. M. Kaganer and A. Proessdorf and A. Trampert and H. Riechert }, title = { Epitaxial growth and structure of (La_1-xLu_x)₂O₃ alloys on Si(111) }, journal = { Applied Physics Letters }, volume = { 97 }, year = { 2010 }, pages = { 031911 } }

TY - JOUR AU - T. Watahiki AU - F. Grosse AU - W. Braun AU - V. M. Kaganer AU - A. Proessdorf AU - A. Trampert AU - H. Riechert TI - Epitaxial growth and structure of (La_1-xLu_x)₂O₃ alloys on Si(111) JF - Applied Physics Letters JA - Appl. Phys. Lett. J1 - APL VL - 97 SP - 031911 PY - 2010/01/01

Dislocation density assessment via x-ray GaN rocking curve scans

@article{ author = { I. Booker and L. Rahimzadeh Khoshroo and J. F. Woitok and V. M. Kaganer and C. Mauder and H. Behmenburg and J. Gruis and M. Heuken and H. Kalisch and R. H. Jansen }, title = { Dislocation density assessment via x-ray GaN rocking curve scans }, journal = { Physica Status Solidi C }, volume = { 7 }, year = { 2010 }, pages = { 1787 } }

TY - JOUR AU - I. Booker AU - L. Rahimzadeh Khoshroo AU - J. F. Woitok AU - V. M. Kaganer AU - C. Mauder AU - H. Behmenburg AU - J. Gruis AU - M. Heuken AU - H. Kalisch AU - R. H. Jansen TI - Dislocation density assessment via x-ray GaN rocking curve scans JF - Physica Status Solidi C JA - Phys. Status Solidi C J1 - PSSC VL - 7 SP - 1787 PY - 2010/01/01

Diffraction peaks from correlated dislocations

@article{ author = { V. M. Kaganer and K. K. Sabelfeld }, title = { Diffraction peaks from correlated dislocations }, journal = { Zeitschrift für Kristallographie }, volume = { 225 }, year = { 2010 }, pages = { 581 } }

TY - JOUR AU - V. M. Kaganer AU - K. K. Sabelfeld TI - Diffraction peaks from correlated dislocations JF - Zeitschrift für Kristallographie JA - Z. Kristallogr. J1 - ZKr VL - 225 SP - 581 PY - 2010/01/01

Heteroepitaxial growth of lattice matched films on GaAs(001)

@article{ author = { B. Jenichen and V. M. Kaganer and R. Shayduk and W. Braun and A. Trampert }, title = { Heteroepitaxial growth of lattice matched films on GaAs(001) }, journal = { Physica Status Solidi A }, volume = { 206 }, year = { 2009 }, pages = { 1740 } }

TY - JOUR AU - B. Jenichen AU - V. M. Kaganer AU - R. Shayduk AU - W. Braun AU - A. Trampert TI - Heteroepitaxial growth of lattice matched films on GaAs(001) JF - Physica Status Solidi A JA - Phys. Status Solidi A J1 - PSSA VL - 206 SP - 1740 PY - 2009/01/01

Kinetic optimum of Volmer-Weber growth

@article{ author = { V. M. Kaganer and B. Jenichen and R. Shayduk and W. Braun and H. Riechert }, title = { Kinetic optimum of Volmer-Weber growth }, journal = { Physical Review Letters }, volume = { 102 }, year = { 2009 }, pages = { 016103 } }

TY - JOUR AU - V. M. Kaganer AU - B. Jenichen AU - R. Shayduk AU - W. Braun AU - H. Riechert TI - Kinetic optimum of Volmer-Weber growth JF - Physical Review Letters JA - Phys. Rev. Lett. J1 - PRL VL - 102 SP - 016103 PY - 2009/01/01

Interfacial roughness of Fe₃Si/GaAs(001) films studied by x-ray crystal truncation rods

@article{ author = { V. M. Kaganer and B. Jenichen and R. Shayduk and W. Braun }, title = { Interfacial roughness of Fe₃Si/GaAs(001) films studied by x-ray crystal truncation rods }, journal = { Physica Status Solidi A }, volume = { 206 }, year = { 2009 }, pages = { 1744 } }

TY - JOUR AU - V. M. Kaganer AU - B. Jenichen AU - R. Shayduk AU - W. Braun TI - Interfacial roughness of Fe₃Si/GaAs(001) films studied by x-ray crystal truncation rods JF - Physica Status Solidi A JA - Phys. Status Solidi A J1 - PSSA VL - 206 SP - 1744 PY - 2009/01/01

X-ray diffraction of epitaxial films with arbitrarily correlated dislocations: Monte Carlo calculation and experiment

@article{ author = { V. M. Kaganer and O. Brandt and H. Riechert and K. K. Sabelfeld }, title = { X-ray diffraction of epitaxial films with arbitrarily correlated dislocations: Monte Carlo calculation and experiment }, journal = { Physical Review B: Solid State }, volume = { 80 }, year = { 2009 }, pages = { 033306 } }

TY - JOUR AU - V. M. Kaganer AU - O. Brandt AU - H. Riechert AU - K. K. Sabelfeld TI - X-ray diffraction of epitaxial films with arbitrarily correlated dislocations: Monte Carlo calculation and experiment JF - Physical Review B: Solid State JA - Phys. Rev. B J1 - VL - 80 SP - 033306 PY - 2009/01/01

X-ray diffraction peaks from partially ordered misfit dislocations

@article{ author = { V. M. Kaganer and K. K. Sabelfeld }, title = { X-ray diffraction peaks from partially ordered misfit dislocations }, journal = { Physical Review B: Solid State }, volume = { 80 }, year = { 2009 }, pages = { 184105 } }

TY - JOUR AU - V. M. Kaganer AU - K. K. Sabelfeld TI - X-ray diffraction peaks from partially ordered misfit dislocations JF - Physical Review B: Solid State JA - Phys. Rev. B J1 - VL - 80 SP - 184105 PY - 2009/01/01

In situ x-ray diffraction study of epitaxial growth of ordered Fe₃Si films

@article{ author = { B. Jenichen and V. M. Kaganer and W. Braun and R. Shayduk and B. Tinkham and J. Herfort }, title = { In situ x-ray diffraction study of epitaxial growth of ordered Fe₃Si films }, journal = { Journal of Materials Science: Materials in Electronics }, volume = { 19 }, year = { 2008 }, pages = { S199 } }

TY - JOUR AU - B. Jenichen AU - V. M. Kaganer AU - W. Braun AU - R. Shayduk AU - B. Tinkham AU - J. Herfort TI - In situ x-ray diffraction study of epitaxial growth of ordered Fe₃Si films JF - Journal of Materials Science: Materials in Electronics JA - J. Mater. Sci. J1 - VL - 19 SP - S199 PY - 2008/01/01