Dr. Vladimir Kaganer

Senior Scientist

Vladimir Kaganer

Telefon: +49 30 20377 486

Raum: 0520

Email: kaganer@pdi-berlin.de

 

Abteilung: Microstructure

Core research areas: Nanoanalytics , III-V nanowires for optoelectronics

 

 

41 Autor V. M. Kaganer , K. K. Sabelfeld
Titel

X-ray diffraction peaks from correlated dislocations: Monte Carlo study of the dislocation screening

Source Acta Cryst. A , 66 , 703 ( 2010 )
2109 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld

42 Autor T. Watahiki , F. Grosse , W. Braun , V. M. Kaganer , A. Proessdorf , A. Trampert , H. Riechert
Titel

Epitaxial growth and structure of (La1-xLux)2O3 alloys on Si(111)

Source Appl. Phys. Lett. , 97 , 031911 ( 2010 )
Download: PDF | 2113 Cite : Bibtex RIS
T. Watahiki, F. Grosse, W. Braun, V. M. Kaganer, A. Proessdorf, A. Trampert, and H. Riechert

43 Autor I. Booker , L. Rahimzadeh Khoshroo , J. F. Woitok , V. M. Kaganer , C. Mauder , H. Behmenburg , J. Gruis , M. Heuken , H. Kalisch , R. H. Jansen
Titel

Dislocation density assessment via x-ray GaN rocking curve scans

Source Phys. Status Solidi C , 7 , 1787 ( 2010 )
2121 Cite : Bibtex RIS
I. Booker, L. Rahimzadeh Khoshroo, J. F. Woitok, V. M. Kaganer, C. Mauder, H. Behmenburg, J. Gruis, M. Heuken, H. Kalisch, and R. H. Jansen

44 Autor V. M. Kaganer , K. K. Sabelfeld
Titel

Diffraction peaks from correlated dislocations

Source Z. Kristallogr. , 225 , 581 ( 2010 )
2145 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld

45 Autor B. Jenichen , V. M. Kaganer , R. Shayduk , W. Braun , A. Trampert
Titel

Heteroepitaxial growth of lattice matched films on GaAs(001)

Source Phys. Status Solidi A , 206 , 1740 ( 2009 )
1971 Cite : Bibtex RIS
B. Jenichen, V. M. Kaganer, R. Shayduk, W. Braun, and A. Trampert

46 Autor V. M. Kaganer , B. Jenichen , R. Shayduk , W. Braun , H. Riechert
Titel

Kinetic optimum of Volmer-Weber growth

Source Phys. Rev. Lett. , 102 , 016103 ( 2009 )
Download: PDF | 1972 Cite : Bibtex RIS
V. M. Kaganer, B. Jenichen, R. Shayduk, W. Braun, and H. Riechert

47 Autor V. M. Kaganer , B. Jenichen , R. Shayduk , W. Braun
Titel

Interfacial roughness of Fe3Si/GaAs(001) films studied by x-ray crystal truncation rods

Source Phys. Status Solidi A , 206 , 1744 ( 2009 )
1973 Cite : Bibtex RIS
V. M. Kaganer, B. Jenichen, R. Shayduk, and W. Braun

48 Autor V. M. Kaganer , O. Brandt , H. Riechert , K. K. Sabelfeld
Titel

X-ray diffraction of epitaxial films with arbitrarily correlated dislocations: Monte Carlo calculation and experiment

Source Phys. Rev. B , 80 , 033306 ( 2009 )
Download: PDF | 2018 Cite : Bibtex RIS
V. M. Kaganer, O. Brandt, H. Riechert, and K. K. Sabelfeld

49 Autor V. M. Kaganer , K. K. Sabelfeld
Titel

X-ray diffraction peaks from partially ordered misfit dislocations

Source Phys. Rev. B , 80 , 184105 ( 2009 )
Download: PDF | 2038 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld

50 Autor B. Jenichen , V. M. Kaganer , W. Braun , R. Shayduk , B. Tinkham , J. Herfort
Titel

In situ x-ray diffraction study of epitaxial growth of ordered Fe3Si films

Source J. Mater. Sci. , 19 , S199 ( 2008 )
1887 Cite : Bibtex RIS
B. Jenichen, V. M. Kaganer, W. Braun, R. Shayduk, B. Tinkham, and J. Herfort