Senior Scientist
Telefon: +49 30 20377 486
Raum: 0520
Email: kaganer@pdi-berlin.de
Abteilung: Microstructure
Core research areas: Nanoanalytics , III-V nanowires for optoelectronics
41 | Autor | T. Watahiki , F. Grosse , V. M. Kaganer , A. Proessdorf , W. Braun |
Titel |
Growth and structural characterization of epitaxial (La1-xLux)2O3 layers grown on Si(111) |
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Source | J. Vac. Sci. Technol. B , 28 , C3A5 ( 2010 ) | |
Bibtex RIS | Cite :
42 | Autor | V. M. Kaganer , K. K. Sabelfeld |
Titel |
X-ray diffraction peaks from correlated dislocations: Monte Carlo study of the dislocation screening |
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Source | Acta Cryst. A , 66 , 703 ( 2010 ) | |
Bibtex RIS | Cite :
43 | Autor | T. Watahiki , F. Grosse , W. Braun , V. M. Kaganer , A. Proessdorf , A. Trampert , H. Riechert |
Titel |
Epitaxial growth and structure of (La1-xLux)2O3 alloys on Si(111) |
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Source | Appl. Phys. Lett. , 97 , 031911 ( 2010 ) | |
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44 | Autor | I. Booker , L. Rahimzadeh Khoshroo , J. F. Woitok , V. M. Kaganer , C. Mauder , H. Behmenburg , J. Gruis , M. Heuken , H. Kalisch , R. H. Jansen |
Titel |
Dislocation density assessment via x-ray GaN rocking curve scans |
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Source | Phys. Status Solidi C , 7 , 1787 ( 2010 ) | |
Bibtex RIS | Cite :
45 | Autor | V. M. Kaganer , K. K. Sabelfeld |
Titel |
Diffraction peaks from correlated dislocations |
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Source | Z. Kristallogr. , 225 , 581 ( 2010 ) | |
Bibtex RIS | Cite :
46 | Autor | B. Jenichen , V. M. Kaganer , R. Shayduk , W. Braun , A. Trampert |
Titel |
Heteroepitaxial growth of lattice matched films on GaAs(001) |
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Source | Phys. Status Solidi A , 206 , 1740 ( 2009 ) | |
Bibtex RIS | Cite :
47 | Autor | V. M. Kaganer , B. Jenichen , R. Shayduk , W. Braun , H. Riechert |
Titel |
Kinetic optimum of Volmer-Weber growth |
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Source | Phys. Rev. Lett. , 102 , 016103 ( 2009 ) | |
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48 | Autor | V. M. Kaganer , B. Jenichen , R. Shayduk , W. Braun |
Titel |
Interfacial roughness of Fe3Si/GaAs(001) films studied by x-ray crystal truncation rods |
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Source | Phys. Status Solidi A , 206 , 1744 ( 2009 ) | |
Bibtex RIS | Cite :
49 | Autor | V. M. Kaganer , O. Brandt , H. Riechert , K. K. Sabelfeld |
Titel |
X-ray diffraction of epitaxial films with arbitrarily correlated dislocations: Monte Carlo calculation and experiment |
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Source | Phys. Rev. B , 80 , 033306 ( 2009 ) | |
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50 | Autor | V. M. Kaganer , K. K. Sabelfeld |
Titel |
X-ray diffraction peaks from partially ordered misfit dislocations |
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Source | Phys. Rev. B , 80 , 184105 ( 2009 ) | |
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