Dr. Vladimir Kaganer

Senior Scientist

Vladimir Kaganer

Telefon: +49 30 20377 486

Raum: 0520

Email: kaganer@pdi-berlin.de

 

Abteilung: Microstructure

Core research areas: Nanoanalytics , III-V nanowires for optoelectronics

 

 

61 Autor V. M. Kaganer
Titel

Crystal truncation rods in kinematical and dynamical x-ray diffraction theories

Source Phys. Rev. B , 75 , 245425 ( 2007 )
Download: PDF | 1816 Cite : Bibtex RIS
and V. M. Kaganer

62 Autor J. Herfort , B. Jenichen , V. M. Kaganer , A. Trampert , H.-P. Schönherr , K. H. Ploog
Titel

Epitaxial Heusler alloy Fe3Si films on GaAs(001) substrates

Source Physica E (Amsterdam) , 32 , 371 ( 2006 )
1576 Cite : Bibtex RIS
J. Herfort, B. Jenichen, V. M. Kaganer, A. Trampert, H.-P. Schönherr, and K. H. Ploog

63 Autor V. M. Kaganer , A. Shalimov , J. Bak-Misiuk , K. H. Ploog
Titel

X-ray diffraction peaks at glancing incidence and glancing exit from highly mismatched epitaxial layers

Source Appl. Phys. Lett. , 89 , 021922 ( 2006 )
Download: PDF | 1644 Cite : Bibtex RIS
V. M. Kaganer, A. Shalimov, J. Bak-Misiuk, and K. H. Ploog

64 Autor V. M. Kaganer , A. Shalimov , J. Bak-Misiuk , K. H. Ploog
Titel

Asymptotic x-ray scattering from highly mismatched epitaxial films

Source J. Phys.: Condens. Matter , 18 , 5047 ( 2006 )
1652 Cite : Bibtex RIS
V. M. Kaganer, A. Shalimov, J. Bak-Misiuk, and K. H. Ploog

65 Autor V. M. Kaganer , K. H. Ploog , K. K. Sabelfeld
Titel

Coarsening of facetted two-dimensional islands by dynamic coalescence

Source Phys. Rev. B , 73 , 115425 ( 2006 )
Download: PDF | 1681 Cite : Bibtex RIS
V. M. Kaganer, K. H. Ploog, and K. K. Sabelfeld

66 Autor X. Guo , W. Braun , B. Jenichen , V. M. Kaganer , B. P. Tinkham , A. Trampert , K. H. Ploog
Titel

Synchrotron x-ray scattering study of thin epitaxial Pr2O3 films on Si(001)

Source J. Appl. Phys. , 100 , 023536 ( 2006 )
Download: PDF | 1707 Cite : Bibtex RIS
X. Guo, W. Braun, B. Jenichen, V. M. Kaganer, B. P. Tinkham, A. Trampert, and K. H. Ploog

67 Autor V. M. Kaganer , O. Brandt , A. Trampert , K. H. Ploog
Titel

X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films

Source Phys. Rev. B , 72 , 045423 ( 2005 )
Download: PDF | 1440 Cite : Bibtex RIS
V. M. Kaganer, O. Brandt, A. Trampert, and K. H. Ploog

68 Autor W. Braun , V. M. Kaganer , B. Jenichen , B. Tinkham , K. H. Ploog
Titel

Surface dynamics of III-V semiconductors studied by in situ x-ray diffraction during molecular beam epitaxy

Source Z. Kristallogr. , 220 , 225 ( 2005 )
558 Cite : Bibtex RIS
W. Braun, V. M. Kaganer, B. Jenichen, B. Tinkham, and K. H. Ploog

69 Autor V. M. Kaganer , W. Braun , B. Jenichen , K. H. Ploog
Titel

Recovery kinetics of the GaAs(001) surface in molecular beam epitaxy studied by in situ x-ray diffraction

Source Physica B , 357 , 165 ( 2005 )
559 Cite : Bibtex RIS
V. M. Kaganer, W. Braun, B. Jenichen, and K. H. Ploog

70 Autor D. K. Satapathy , B. Jenichen , W. Braun , V. M. Kaganer , L. Däweritz , K. H. Ploog
Titel

In-situ grazing incidence x-ray diffraction study of strain evolution during growth and postgrowth annealing of MnAs on GaAs(113)A

Source J. Phys. D: Appl. Phys. , 38 , A164 ( 2005 )
1469 Cite : Bibtex RIS
D. K. Satapathy, B. Jenichen, W. Braun, V. M. Kaganer, L. Däweritz, and K. H. Ploog