Dr. Vladimir Kaganer

Senior Scientist

Vladimir Kaganer

Telefon: +49 30 20377 486

Raum: 0520

Email: kaganer@pdi-berlin.de

 

Abteilung: Microstructure

Core research areas: Nanoanalytics , III-V nanowires for optoelectronics

 

 

41 Autor M. Wölz , V. M. Kaganer , O. Brandt , L. Geelhaar , H. Riechert
Titel

Erratum: “Analyzing the growth of InxGa1-xN/GaN superlattices in selfinduced GaN nanowires by x-ray diffraction” [Appl. Phys. Lett. 98, 261907 (2011)]

Source Appl. Phys. Lett. , 100 , 179902 ( 2012 )
Download: PDF | 2393 Cite : Bibtex RIS
M. Wölz, V. M. Kaganer, O. Brandt, L. Geelhaar, and H. Riechert

42 Autor V. M. Kaganer , K. K. Sabelfeld
Titel

Short range correlations of misfit dislocations in the x-ray diffraction peaks

Source Phys. Status Solidi A , 208 , 2563 ( 2011 )
2177 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld

43 Autor M. Wölz , V. M. Kaganer , O. Brandt , L. Geelhaar , H. Riechert
Titel

Analyzing the growth of InxGa1-xN/GaN superlattices in self-induced GaN nanowires by x-ray diffraction

Source Appl. Phys. Lett. , 98 , 261907 ( 2011 )
Download: PDF | 2208 Cite : Bibtex RIS
M. Wölz, V. M. Kaganer, O. Brandt, L. Geelhaar, and H. Riechert

44 Autor V. M. Kaganer , M. Wölz , O. Brandt , L. Geelhaar , H. Riechert
Titel

X-ray diffraction profiles from axial nanowire heterostructures

Source Phys. Rev. B , 83 , 245321 ( 2011 )
Download: PDF | 2211 Cite : Bibtex RIS
V. M. Kaganer, M. Wölz, O. Brandt, L. Geelhaar, and H. Riechert

45 Autor A. Benediktovitch , A. Ulyanenkov , F. Rinaldi , K. Saito , V. M. Kaganer
Titel

Concentration and relaxation depth profiles of InxGa1-xAs/GaAs and GaAs1-xPx/GaAs graded epitaxial films studied by x-ray diffraction

Source Phys. Rev. B , 84 , 035302 ( 2011 )
Download: PDF | 2233 Cite : Bibtex RIS
A. Benediktovitch, A. Ulyanenkov, F. Rinaldi, K. Saito, and V. M. Kaganer

46 Autor T. Watahiki , F. Grosse , V. M. Kaganer , A. Proessdorf , W. Braun
Titel

Growth and structural characterization of epitaxial (La1-xLux)2O3 layers grown on Si(111)

Source J. Vac. Sci. Technol. B , 28 , C3A5 ( 2010 )
2065 Cite : Bibtex RIS
T. Watahiki, F. Grosse, V. M. Kaganer, A. Proessdorf, and W. Braun

47 Autor V. M. Kaganer , K. K. Sabelfeld
Titel

X-ray diffraction peaks from correlated dislocations: Monte Carlo study of the dislocation screening

Source Acta Cryst. A , 66 , 703 ( 2010 )
2109 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld

48 Autor T. Watahiki , F. Grosse , W. Braun , V. M. Kaganer , A. Proessdorf , A. Trampert , H. Riechert
Titel

Epitaxial growth and structure of (La1-xLux)2O3 alloys on Si(111)

Source Appl. Phys. Lett. , 97 , 031911 ( 2010 )
Download: PDF | 2113 Cite : Bibtex RIS
T. Watahiki, F. Grosse, W. Braun, V. M. Kaganer, A. Proessdorf, A. Trampert, and H. Riechert

49 Autor I. Booker , L. Rahimzadeh Khoshroo , J. F. Woitok , V. M. Kaganer , C. Mauder , H. Behmenburg , J. Gruis , M. Heuken , H. Kalisch , R. H. Jansen
Titel

Dislocation density assessment via x-ray GaN rocking curve scans

Source Phys. Status Solidi C , 7 , 1787 ( 2010 )
2121 Cite : Bibtex RIS
I. Booker, L. Rahimzadeh Khoshroo, J. F. Woitok, V. M. Kaganer, C. Mauder, H. Behmenburg, J. Gruis, M. Heuken, H. Kalisch, and R. H. Jansen

50 Autor V. M. Kaganer , K. K. Sabelfeld
Titel

Diffraction peaks from correlated dislocations

Source Z. Kristallogr. , 225 , 581 ( 2010 )
2145 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld