Dr. Vladimir Kaganer

Senior Scientist

Vladimir Kaganer

Telefon: +49 30 20377 486

Raum: 0520

Email: kaganer@pdi-berlin.de

 

Abteilung: Microstructure

Core research areas: Nanoanalytics , III-V nanowires for optoelectronics

 

 

41 Autor A. Benediktovitch , A. Ulyanenkov , F. Rinaldi , K. Saito , V. M. Kaganer
Titel

Concentration and relaxation depth profiles of InxGa1-xAs/GaAs and GaAs1-xPx/GaAs graded epitaxial films studied by x-ray diffraction

Source Phys. Rev. B , 84 , 035302 ( 2011 )
Download: PDF | 2233 Cite : Bibtex RIS
A. Benediktovitch, A. Ulyanenkov, F. Rinaldi, K. Saito, and V. M. Kaganer

42 Autor T. Watahiki , F. Grosse , V. M. Kaganer , A. Proessdorf , W. Braun
Titel

Growth and structural characterization of epitaxial (La1-xLux)2O3 layers grown on Si(111)

Source J. Vac. Sci. Technol. B , 28 , C3A5 ( 2010 )
2065 Cite : Bibtex RIS
T. Watahiki, F. Grosse, V. M. Kaganer, A. Proessdorf, and W. Braun

43 Autor V. M. Kaganer , K. K. Sabelfeld
Titel

X-ray diffraction peaks from correlated dislocations: Monte Carlo study of the dislocation screening

Source Acta Cryst. A , 66 , 703 ( 2010 )
2109 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld

44 Autor T. Watahiki , F. Grosse , W. Braun , V. M. Kaganer , A. Proessdorf , A. Trampert , H. Riechert
Titel

Epitaxial growth and structure of (La1-xLux)2O3 alloys on Si(111)

Source Appl. Phys. Lett. , 97 , 031911 ( 2010 )
Download: PDF | 2113 Cite : Bibtex RIS
T. Watahiki, F. Grosse, W. Braun, V. M. Kaganer, A. Proessdorf, A. Trampert, and H. Riechert

45 Autor I. Booker , L. Rahimzadeh Khoshroo , J. F. Woitok , V. M. Kaganer , C. Mauder , H. Behmenburg , J. Gruis , M. Heuken , H. Kalisch , R. H. Jansen
Titel

Dislocation density assessment via x-ray GaN rocking curve scans

Source Phys. Status Solidi C , 7 , 1787 ( 2010 )
2121 Cite : Bibtex RIS
I. Booker, L. Rahimzadeh Khoshroo, J. F. Woitok, V. M. Kaganer, C. Mauder, H. Behmenburg, J. Gruis, M. Heuken, H. Kalisch, and R. H. Jansen

46 Autor V. M. Kaganer , K. K. Sabelfeld
Titel

Diffraction peaks from correlated dislocations

Source Z. Kristallogr. , 225 , 581 ( 2010 )
2145 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld

47 Autor B. Jenichen , V. M. Kaganer , R. Shayduk , W. Braun , A. Trampert
Titel

Heteroepitaxial growth of lattice matched films on GaAs(001)

Source Phys. Status Solidi A , 206 , 1740 ( 2009 )
1971 Cite : Bibtex RIS
B. Jenichen, V. M. Kaganer, R. Shayduk, W. Braun, and A. Trampert

48 Autor V. M. Kaganer , B. Jenichen , R. Shayduk , W. Braun , H. Riechert
Titel

Kinetic optimum of Volmer-Weber growth

Source Phys. Rev. Lett. , 102 , 016103 ( 2009 )
Download: PDF | 1972 Cite : Bibtex RIS
V. M. Kaganer, B. Jenichen, R. Shayduk, W. Braun, and H. Riechert

49 Autor V. M. Kaganer , B. Jenichen , R. Shayduk , W. Braun
Titel

Interfacial roughness of Fe3Si/GaAs(001) films studied by x-ray crystal truncation rods

Source Phys. Status Solidi A , 206 , 1744 ( 2009 )
1973 Cite : Bibtex RIS
V. M. Kaganer, B. Jenichen, R. Shayduk, and W. Braun

50 Autor V. M. Kaganer , O. Brandt , H. Riechert , K. K. Sabelfeld
Titel

X-ray diffraction of epitaxial films with arbitrarily correlated dislocations: Monte Carlo calculation and experiment

Source Phys. Rev. B , 80 , 033306 ( 2009 )
Download: PDF | 2018 Cite : Bibtex RIS
V. M. Kaganer, O. Brandt, H. Riechert, and K. K. Sabelfeld