Scanning x-ray microscopy: A sub-100 nm probe toward strain and composition in seeded horizontal Ge(110) nanowires

@article{ author = { M. Hanke and C. Richter and F. Lange and A. Reis and J. Parker and T. Boeck }, title = { Scanning x-ray microscopy: A sub-100 nm probe toward strain and composition in seeded horizontal Ge(110) nanowires }, journal = { Applied Physics Letters }, volume = { 120 }, year = { 2022 }, pages = { 101902 } }

TY - JOUR AU - M. Hanke AU - C. Richter AU - F. Lange AU - A. Reis AU - J. Parker AU - T. Boeck TI - Scanning x-ray microscopy: A sub-100 nm probe toward strain and composition in seeded horizontal Ge(110) nanowires JF - Applied Physics Letters JA - Appl. Phys. Lett. J1 - APL VL - 120 SP - 101902 PY - 2022/03/10