AFM image of h-BN monolayer islands grown on epitaxial graphene on SiC. The inset shows the height profile along the red dotted line, which reveals a second h-BN layer close to a nanoparticle in the center of the first extended monolayer, which nucleated at a wrinkle in graphene.
We present a direct growth approach for h-BN/graphene heterostructures under controlled conditions using molecular beam epitaxy. The comprehensive growth study (covering various temperatures and growth times) reveals the evolution of 2D h-BN layers during van der Waals epitaxy on graphene from nucleation to coalesced layers. As a substrate high quality epitaxial graphene on SiC was selected for its good reproducibility. A detailed investigation using various correlated atomic force microscopy (AFM) techniques as well as Raman and X-ray photoemission spectroscopy revealed a nucleation which is mediated by morphological defects (wrinkles and step edges) and point defects in epitaxial graphene from where the 2D h-BN layers expand laterally (as a monolayer) and vertically (as multiple layers). Therefore, this study helps understanding the nucleation behavior during van der Waals epitaxy at elevated temperatures, which is a first step towards a controllable and scalable fabrication of 2D heterostructures.
1 | Autor | M. Heilmann , M. Bashouti , H. Riechert , J. M. J. Lopes |
Titel |
Defect mediated van der Waals epitaxy of hexagonal boron nitride on graphene |
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Source | 2D Mater. , 5 , 025004 ( 2018 ) | |
DOI : 10.1088/2053-1583/aaa4cb | Cite : Bibtex RIS |