PDI -> Research -> Core Research Areas -> Nanoanalytics


The ongoing miniaturization in semiconductor technology increases the demand for precise information on the structural and compositional quality of low-dimensional systems and nanomaterials.


The mission of this Core Research Area is the development and combination of sophisticated experimental and theoretical tools for materials analysis on the nanometer scale. For this purpose synchrotron x-ray diffraction is carried out to investigate surfaces and interfaces in epitaxial layers and three-dimensional nanostructures during growth. After growth the structural and optical properties of as-grown materials are investigated by various electron microscopy techniques including diffraction and spectroscopy with high spatial resolution. In addition, low-temperature scanning tunneling microscopy is applied to build and analyze individual nanostructures. Our research addresses the following topics: 

  • Interfaces in low-dimensional heterostructures and nano-systems
  • Order-disorder phenomena and phase transitions in alloys and oxides
  • Structure, chemistry and mechanical properties of metastable and nano-structured systems
  • Single-atom manipulation by low-temperature scanning tunneling microscopy

Selected Publications

3 Author S. Fölsch , J. Martinez-Blanco , J. Yang , K. Kanisawa , S. C. Erwin

Quantum dots with single-atom precision

Source Nature Nanotechnol. , 9 , 505 ( 2014 )
DOI : 10.1038/NNANO.2014.129 | 2491 Cite : Bibtex RIS
S. Fölsch, J. Martinez-Blanco, J. Yang, K. Kanisawa, and S. C. Erwin

2 Author E. Luna , A. Guzman , A. Trampert , G. Alvarez

Critical role of two-dimensional island-mediated growth on the formation of semiconductor heterointerfaces

Source Phys. Rev. Lett. , 109 , 126101 ( 2012 )
Download: PDF | 2325 Cite : Bibtex RIS
E. Luna, A. Guzman, A. Trampert, and G. Alvarez

1 Author M. Hanke , V. M. Kaganer , O. Bierwagen , M. Niehle , A. Trampert

Delayed crystallization of ultrathin Gd2O3 on Si(111) observed by in vivo x-ray diffraction

Source Nanoscale Res. Lett. , 7 , 203 ( 2012 )
Download: PDF | 2231 Cite : Bibtex RIS
M. Hanke, V. M. Kaganer, O. Bierwagen, M. Niehle, and A. Trampert


Dr. Achim Trampert

Head of Department 

+49 30 20377-280