The physical properties of ferromagnetic Heusler alloys or semiconducting oxide layers, for example, depend on their structural order and phase stability. The underlying physical principles of phase stabilities and phase transformation processes are explored with high spatial and temporal resolution in dependence on internal parameters like chemical composition and strain state as well as external parameters given by temperature and growth kinetics. The degree of order/disorder and their spatial distribution within thin films are determined quantitatively by in-situ and ex-situ X-ray diffraction and electron microscopy methods.
Our research is currently focused on the following topics:
5 | Author | M. Terker , B. Jenichen , J. Herfort , A. Trampert |
Title |
In-situ transmission electron microscopy of solid phase epitaxy of Ge on Fe3Si |
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Source | Semicond. Sci. Technol. , 34 , 124004 ( 2019 ) | |
DOI : 10.1088/1361-6641/ab4fad | Cite : Bibtex RIS |
4 | Author | K. Berlin , A. Trampert |
Title |
Phase Stability and Anisotropic Sublimation of Cubic Ge−Sb−Te Alloy Observed by In Situ Transmission Electron Microscopy |
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Source | J. Phys. Chem. C , 122 , 2968 ( 2018 ) | |
DOI : 10.1021/acs.jpcc.7b09855 | Cite : Bibtex RIS |
3 | Author | B. Jenichen , M. Hanke , S. Gaucher , A. Trampert , J. Herfort , H. Kirmse , B. Haas , E. Willinger , X. Huang , S. C. Erwin |
Title |
Ordered structure of FeGe2 formed during solid-phase epitaxy |
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Source | Phys. Rev. Mater. , 2 , 051402 ( 2018 ) | |
DOI : 10.1103/PhysRevMaterials.2.051402 | Cite : Bibtex RIS |
2 | Author | Z. Cheng , M. Hanke , P. Vogt , O. Bierwagen , A. Trampert |
Title |
Phase formation and strain relaxation of Ga2O3 on various sapphire orientations as studied by synchrotron-based x-ray diffraction |
|
Source | Appl. Phys. Lett. , 111 , 162104 ( 2017 ) | |
DOI : 10.1063/1.4998804 | Download: PDF | Cite : Bibtex RIS |
1 | Author | K. Berlin , A. Trampert |
Title |
Liquid-solid phase transition of Ge-Sb-Te alloy observed by in-situ transmission electron microscopy |
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Source | Ultramicroscopy , 178 , 27 ( 2017 ) | |
DOI : 10.1016/j.ultramic.2016.10.010 | Cite : Bibtex RIS |