In situ x-ray analysis of misfit strain and curvature of bent polytypic GaAs–InxGa1−xAs core–shell nanowires

@article{ author = { M. Al-Humaidi and L. Feigl and J. Jakob and P. Schroth and A. AlHassan and A. Davtyan and J. Herranz and T. Anjum and D. Novikov and S. Francoual and L. Geelhaar and T. Baumbach and U. Pietsch }, title = { In situ x-ray analysis of misfit strain and curvature of bent polytypic GaAs–InxGa1−xAs core–shell nanowires }, journal = { Nanotechnology }, volume = { 33 }, year = { 2021 }, pages = { 015601 } }

TY - JOUR AU - M. Al-Humaidi AU - L. Feigl AU - J. Jakob AU - P. Schroth AU - A. AlHassan AU - A. Davtyan AU - J. Herranz AU - T. Anjum AU - D. Novikov AU - S. Francoual AU - L. Geelhaar AU - T. Baumbach AU - U. Pietsch TI - In situ x-ray analysis of misfit strain and curvature of bent polytypic GaAs–InxGa1−xAs core–shell nanowires JF - Nanotechnology JA - Nanotechnology J1 - NAN VL - 33 SP - 015601 PY - 2021/10/20