PDI -> Staff ->

Dr. Vladimir Kaganer

Senior Scientist

Vladimir Kaganer

phone: +49 30 20377 486

room: 0520

email: kaganer@pdi-berlin.de

 

Department: Microstructure

Core research areas: Nanoanalytics , III-V nanowires for optoelectronics

 

 

41 Author A. Benediktovitch , A. Ulyanenkov , F. Rinaldi , K. Saito , V. M. Kaganer
Title

Concentration and relaxation depth profiles of InxGa1-xAs/GaAs and GaAs1-xPx/GaAs graded epitaxial films studied by x-ray diffraction

Source Phys. Rev. B , 84 , 035302 ( 2011 )
Download: PDF | 2233 Cite : Bibtex RIS
A. Benediktovitch, A. Ulyanenkov, F. Rinaldi, K. Saito, and V. M. Kaganer

42 Author T. Watahiki , F. Grosse , V. M. Kaganer , A. Proessdorf , W. Braun
Title

Growth and structural characterization of epitaxial (La1-xLux)2O3 layers grown on Si(111)

Source J. Vac. Sci. Technol. B , 28 , C3A5 ( 2010 )
2065 Cite : Bibtex RIS
T. Watahiki, F. Grosse, V. M. Kaganer, A. Proessdorf, and W. Braun

43 Author V. M. Kaganer , K. K. Sabelfeld
Title

X-ray diffraction peaks from correlated dislocations: Monte Carlo study of the dislocation screening

Source Acta Cryst. A , 66 , 703 ( 2010 )
2109 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld

44 Author T. Watahiki , F. Grosse , W. Braun , V. M. Kaganer , A. Proessdorf , A. Trampert , H. Riechert
Title

Epitaxial growth and structure of (La1-xLux)2O3 alloys on Si(111)

Source Appl. Phys. Lett. , 97 , 031911 ( 2010 )
Download: PDF | 2113 Cite : Bibtex RIS
T. Watahiki, F. Grosse, W. Braun, V. M. Kaganer, A. Proessdorf, A. Trampert, and H. Riechert

45 Author I. Booker , L. Rahimzadeh Khoshroo , J. F. Woitok , V. M. Kaganer , C. Mauder , H. Behmenburg , J. Gruis , M. Heuken , H. Kalisch , R. H. Jansen
Title

Dislocation density assessment via x-ray GaN rocking curve scans

Source Phys. Status Solidi C , 7 , 1787 ( 2010 )
2121 Cite : Bibtex RIS
I. Booker, L. Rahimzadeh Khoshroo, J. F. Woitok, V. M. Kaganer, C. Mauder, H. Behmenburg, J. Gruis, M. Heuken, H. Kalisch, and R. H. Jansen

46 Author V. M. Kaganer , K. K. Sabelfeld
Title

Diffraction peaks from correlated dislocations

Source Z. Kristallogr. , 225 , 581 ( 2010 )
2145 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld

47 Author B. Jenichen , V. M. Kaganer , R. Shayduk , W. Braun , A. Trampert
Title

Heteroepitaxial growth of lattice matched films on GaAs(001)

Source Phys. Status Solidi A , 206 , 1740 ( 2009 )
1971 Cite : Bibtex RIS
B. Jenichen, V. M. Kaganer, R. Shayduk, W. Braun, and A. Trampert

48 Author V. M. Kaganer , B. Jenichen , R. Shayduk , W. Braun , H. Riechert
Title

Kinetic optimum of Volmer-Weber growth

Source Phys. Rev. Lett. , 102 , 016103 ( 2009 )
Download: PDF | 1972 Cite : Bibtex RIS
V. M. Kaganer, B. Jenichen, R. Shayduk, W. Braun, and H. Riechert

49 Author V. M. Kaganer , B. Jenichen , R. Shayduk , W. Braun
Title

Interfacial roughness of Fe3Si/GaAs(001) films studied by x-ray crystal truncation rods

Source Phys. Status Solidi A , 206 , 1744 ( 2009 )
1973 Cite : Bibtex RIS
V. M. Kaganer, B. Jenichen, R. Shayduk, and W. Braun

50 Author V. M. Kaganer , O. Brandt , H. Riechert , K. K. Sabelfeld
Title

X-ray diffraction of epitaxial films with arbitrarily correlated dislocations: Monte Carlo calculation and experiment

Source Phys. Rev. B , 80 , 033306 ( 2009 )
Download: PDF | 2018 Cite : Bibtex RIS
V. M. Kaganer, O. Brandt, H. Riechert, and K. K. Sabelfeld