Polarization detector with a high degree of integration are for example important for reading of magneto-optical data storage media, which are based on the principle of the magneto-optical Kerr effect, or for optical circuits on a polarization scrambled logic based. The following technology allows for the first time the large scale integration of polarization detectors.
The innovative polarization detector device consists of a photosensitive layer, which has a high absorption coefficient along one direction and a low absorption coefficient along a second direction perpendicular to the first direction. The absorption coefficients are characterized by their crystalline structure. Therefore a wurtzit structure is used which intrinsically shows an anisotropic light absorption characteristic. This allows a high degree of integration and the realization of compact, cost effective, and large scale integrable polarization detectors.
The technology is available for in-licensing or joint development.
The proof of concept of the manufacturing process has been established.
A German patent, DE10228311, was filed in 2002 and granted in 2012.
Currently not available