Nanoanalytics

Synchrotron-based x-ray diffraction studies

Synchrotron-based X-ray diffraction is carried out to investigate surfaces of compound semiconductors and semiconducting oxides as well as interfaces in epitaxial thin layers and three-dimensional nanostructures. The measurements can be performed both during growth and under tailored conditions.

 

The following facilities with special experimental tools are used for our purposes: 

  • PDI operates a dedicated experimental facility at the Berlin Synchrotron BESSYII (HZB) for in-situ studies PHARAO (BESSYII)
  • Highly specialized beamlines at other synchrotron sources as PETRAIII in Hamburg and the ESRF in Grenoble are frequently used to perform experiments, which rely on dedicated setups and very particular x-ray radiation characteristics as e.g., nano-sized foci, brilliance and coherence External Synchrotron Sources.
Contact

Dr. Achim Trampert

Head of Department 

+49 30 20377-280

trampert@pdi-berlin.de