Synchrotron-based X-ray diﬀraction is carried out to investigate surfaces of compound semiconductors and semiconducting oxides as well as interfaces in epitaxial thin layers and three-dimensional nanostructures. The measurements can be performed both during growth and under tailored conditions.
The following facilities with special experimental tools are used for our purposes:
- PDI operates a dedicated experimental facility at the Berlin Synchrotron BESSYII (HZB) for in-situ studies PHARAO (BESSYII)
- Highly specialized beamlines at other synchrotron sources as PETRAIII in Hamburg and the ESRF in Grenoble are frequently used to perform experiments, which rely on dedicated setups and very particular x-ray radiation characteristics as e.g., nano-sized foci, brilliance and coherence External Synchrotron Sources.