External Synchrotron Sources

Ingredients of a nano x-ray diffraction experiment at PETRAIII at the example of a single (In,Ga)N/GaN rod: locally resolved x-ray fluorescence as a tool to adjust the sample (left), the diffraction geometry (bottom right), and the local measurements at different heights (top right). Two examples of reciprocal space maps around the GaN(1-100) reflection are given here. The shape function of the rod becomes visible in the form of a six-armed star, while the individual fingers are modulated by the shape function related to the structural constitution of the illuminated volume.

Addressing questions, which require very specific source characteristics as brilliance or spot size, we are regularly performing complementary x-ray diffraction measurements at dedicated third-generation synchrotron sources like PETRAIII (Hamburg), the Diamond Light Source (UK) and the European Synchrotron ESRF (France). Of particular interest for us are approaching techniques like diffraction with highly focused x-rays to investigate individual low-dimensional structures. Thereby, we overcome the ensemble average inherent to x-ray techniques applying millimetre-sized x-ray foci. On the other hand, investigations of ultrathin 2D van der Waals layers, especially if consisting of weak scatterers, as B, N, and C-atoms, require extremely brilliant sources and have been performed at the external sources as well.

Selected Publications

Nano x-ray diffraction
2 Author T. Krause , M. Hanke , L. Nicolai , Z. Cheng , M. Niehle , A. Trampert , M. Kahnt , G. Falkenberg , C. Schroer , J. Hartmann , H. Zhou , H.-H. Wehmann , A. Waag
Title

Structural and compositional analysis of isolated core-shell (In,Ga)N/GaN rods based on nanofocus x-ray diffraction and scanning transmission electron microscopy

Source Phys. Rev. Applied , 7 , 024033 ( 2017 )
DOI : 10.1103/PhysRevApplied.7.024033 | 2881 Cite : Bibtex RIS
T. Krause, M. Hanke, L. Nicolai, Z. Cheng, M. Niehle, A. Trampert, M. Kahnt, G. Falkenberg, C. Schroer, J. Hartmann, H. Zhou, H.-H. Wehmann, and A. Waag

1 Author T. Krause , M. Hanke , Z. Cheng , M. Niehle , A. Trampert , M. Rosenthal , M. Burghammer , J. Ledig , J. Hartmann , H. Zhou , H.-H. Wehmann , A. Waag
Title

Nanofocus x-ray diffraction and cathodoluminescence investigations on individual core-shell (In,Ga)N/GaN rod light emitting diodes

Source Nanotechnol. , 27 , 325707 ( 2016 )
DOI : 10.1088/0957-4484/27/32/325707 | 2812 Cite : Bibtex RIS
T. Krause, M. Hanke, Z. Cheng, M. Niehle, A. Trampert, M. Rosenthal, M. Burghammer, J. Ledig, J. Hartmann, H. Zhou, H.-H. Wehmann, and A. Waag

2D materials
4 Author S. Nakhaie , M. Heilmann , T. Krause , M. Hanke , J. M. J. Lopes
Title

Nucleation and growth of atomically thin hexagonal boron nitride on Ni/MgO(111) by molecular beam epitaxy

Source J. Appl. Phys. , 125 , 115301 ( 2019 )
DOI : 10.1063/1.5081806 | Download: PDF | 3074 Cite : Bibtex RIS
S. Nakhaie, M. Heilmann, T. Krause, M. Hanke, and J. M. J. Lopes

3 Author M. Heilmann , M. Bashouti , H. Riechert , J. M. J. Lopes
Title

Defect mediated van der Waals epitaxy of hexagonal boron nitride on graphene

Source 2D Mater. , 5 , 025004 ( 2018 )
DOI : 10.1088/2053-1583/aaa4cb | 2962 Cite : Bibtex RIS
M. Heilmann, M. Bashouti, H. Riechert, and J. M. J. Lopes

2 Author R. Wang , F. R. L. Lange , S. Cecchi , M. Hanke , M. Wuttig , R. Calarco
Title

2D or not 2D: Strain tuning in weakly coupled heterostructures

Source Adv. Funct. Mater. , 28 , 1705901 ( 2018 )
DOI : 10.1002/adfm.201705901 | 2955 Cite : Bibtex RIS
R. Wang, F. R. L. Lange, S. Cecchi, M. Hanke, M. Wuttig, and R. Calarco

1 Author J. M. Wofford , S. Nakhaie , T. Krause , X. Liu , M. Ramsteiner , M. Hanke , H. Riechert , J. M. J. Lopes
Title

A hybrid MBE-based growth method for large-area synthesis of stacked hexagonal boron nitride/graphene heterostructures

Source Sci. Rep. , 7 , 43644 ( 2017 )
DOI : 10.1038/srep43644 | Download: PDF | 2865 Cite : Bibtex RIS
J. M. Wofford, S. Nakhaie, T. Krause, X. Liu, M. Ramsteiner, M. Hanke, H. Riechert, and J. M. J. Lopes

Contact

Dr. Achim Trampert

Head of Department 

+49 30 20377-280

trampert@pdi-berlin.de