Nanoanalytics
Real structure and mechanical properties of metastable and nanostructured systems
The functionality of many metastable or nanoscale materials (such as graphene or 2D layer crystals) depends essentially on their structural perfection and compositional homogeneity on the atomic to mesoscopic scale. In-situ/ex-situ X-ray diffraction in combination with (scanning) transmission electron microscopy (TEM) techniques are used to comprehensively explore these materials with respect to their structural, chemical and mechanical properties on all relevant length scales. The exact knowledge of these properties serves as a basis for the targeted adjustment and optimization of the material functionality.
Our research currently focuses on the following topical and methodological issues:
- Structural research on graphene, 2D layer crystals and metastable layered systems
- Composition fluctuations in dilute semiconductor compounds
- Synchrotron-based x-ray diffraction for in-situ and ex-situ studies
- Elastic and plastic properties of nano-objects (nanoindentation)
- Numerical description of mechanical properties using Finite Element Method
While conventional TEM delivers a 2D image of the 3D object, electron tomography provides a complete 3D reconstruction of the real objects. The method offers new possibilities for structural analysis and presentation down to the nanometer range. It is especially useful for material questions based on an inhomogeneous spatial distribution of structural units or on chemical composition fluctuations, as well as on complex defect structures (see Application Laboratory Electron Tomography).
Selected Paublications
| 4 | Author | M. Heilmann , A. S. Prikhodko , M. Hanke , A. Sabelfeld , N. I. Borgardt , J. M. J. Lopes |
| Title |
Influence of Proximity to Supporting Substrate on van der Waals Epitaxy of Atomically Thin Graphene/hexagonal Boron Nitride Heterostructures |
|
| Source | ACS Appl. Mater. Interfaces , 12 , 8897 ( 2020 ) | |
| DOI : 10.1021/acsami.9b21490 | Cite : Bibtex RIS | ||
| 3 | Author | L. Nicolai , Ž. Gačević , E. Calleja , A. Trampert |
| Title |
Electron tomography of pencil-shaped GaN/(In,Ga)N core-shell nanowires |
|
| Source | Nanoscale Res. Lett. , 14 , 232 ( 2019 ) | |
| DOI : 10.1186/s11671-019-3072-1 | Download: PDF | Cite : Bibtex RIS | ||
| 2 | Author | J. Berggren , M. Hanke , E. Luna , A. Trampert |
| Title |
Supernormal hardness increase of dilute Ga(As, N) thin films |
|
| Source | J. Appl. Phys. , 121 , 095105 ( 2017 ) | |
| DOI : 10.1063/1.4978019 | Download: PDF | Cite : Bibtex RIS | ||
| 1 | Author | M. Wu , M. Hanke , E. Luna , J. Puustinen , M. Guina , A. Trampert |
| Title |
Detecting lateral composition modulation in dilute GaAsBi epilayers |
|
| Source | Nanotechnology , 26 , 425701 ( 2015 ) | |
| DOI : 10.1088/0957-4484/26/42/425701 | Cite : Bibtex RIS | ||
Contact
Paul-Drude-Institut für Festkörperelektronik Leibniz-Institut im Forschungsverbund Berlin e.V.
Email Webmaster | Imprint | Data Protection | Intranet
Member of: