Nanoanalytics

Dr. Oliver Bierwagen

Senior Scientist

Speaker of Scientists

Oliver Bierwagen

phone: +49 30 20377 491

room: 0713

email: bierwagen@pdi-berlin.de

 

Department: Epitaxy

Core research areas: Nanofabrication

 

Research interests:

Semiconductors

Oxides

Molecular Beam Epitaxy

Transport measurements

 

 

31 Author T. C. Kaspar , P. V. Sushko , M. E. Bowden , S. M. Heald , A. Papadogianni , C. Tschammer , O. Bierwagen , S. A. Chambers
Title

Defect compensation by Cr vacancies and oxygen interstitials in Ti4+-doped Cr2O3 epitaxial thin films

Source Phys. Rev. B , 94 , 155409 ( 2016 )
DOI : 10.1103/PhysRevB.94.155409 | Download: PDF | 2859 Cite : Bibtex RIS
T. C. Kaspar, P. V. Sushko, M. E. Bowden, S. M. Heald, A. Papadogianni, C. Tschammer, O. Bierwagen, and S. A. Chambers

32 Author P. Vogt , O. Bierwagen
Title

Kinetics versus thermodynamics of the metal incorporation in molecular beam epitaxy of (InxGa1-x)2O3

Source APL Mater. , 4 , 086112 ( 2016 )
DOI : 10.1063/1.4961513 | Download: PDF | 2844 Cite : Bibtex RIS
P. Vogt, and O. Bierwagen

33 Author P. Vogt , O. Bierwagen
Title

Comparison of the growth kinetics of In2O3 and Ga2O3 and their suboxide desorption during plasma-assisted molecular beam epitaxy

Source Appl. Phys. Lett. , 109 , 062103 ( 2016 )
DOI : 10.1063/1.4960633 | Download: PDF | 2832 Cite : Bibtex RIS
P. Vogt, and O. Bierwagen

34 Author J. Rombach , A. Papadogianni , M. Mischo , V. Cimalla , L. Kirste , O. Ambacher , T. Berthold , S. Krischok , M. Himmerlich , Sören Selve , O. Bierwagen
Title

The role of surface electron accumulation and bulk doping for gas-sensing explored with single-crystalline In2O3 thin films

Source Sens. Actuators B Chem. , 236 , 909 ( 2016 )
DOI : 10.1016/j.snb.2016.03.079 | 2784 Cite : Bibtex RIS
J. Rombach, A. Papadogianni, M. Mischo, V. Cimalla, L. Kirste, O. Ambacher, T. Berthold, S. Krischok, M. Himmerlich, Sören Selve, and O. Bierwagen

35 Author M.V. Frischbier , H.F. Wardenga , M. Weidner , O. Bierwagen , J. Jia , Y. Shigesato , A. Klein
Title

Influence of dopant species and concentration on grain boundary scattering in degenerately doped In2O3 thin films

Source Thin Solid Films , 614 , 62 ( 2016 )
DOI : 10.1016/j.tsf.2016.03.022 | 2781 Cite : Bibtex RIS
M.V. Frischbier, H.F. Wardenga, M. Weidner, O. Bierwagen, J. Jia, Y. Shigesato, and A. Klein

36 Author O. Bierwagen , J. Rombach , J.S. Speck
Title

Faceting control by the stoichiometry influence on the surface free energy of low-index bcc-In2O3 surfaces

Source J. Phys.: Condens. Matter , 28 , 224006 ( 2016 )
DOI : 10.1088/0953-8984/28/22/224006 | 2727 Cite : Bibtex RIS
O. Bierwagen, J. Rombach, and J.S. Speck

37 Author P. Vogt , O. Bierwagen
Title

Reaction kinetics and growth window for plasma-assisted molecular beam epitaxy of Ga2O3: Incorporation of Ga vs. Ga2O desorption

Source Appl. Phys. Lett. , 108 , 072101 ( 2016 )
DOI : 10.1063/1.4942002 | Download: PDF | 2782 Cite : Bibtex RIS
P. Vogt, and O. Bierwagen

38 Author M. Feneberg , J. Nixdorf , C. Lidig , R. Goldhahn , Z. Galazka , O. Bierwagen , J.S. Speck
Title

Many-electron effects on the dielectric function of cubic In2O3: Effective electron mass, band-nonparabolicity, and Burstein-Moss shift

Source Phys. Rev. B , 93 , 045203 ( 2016 )
DOI : 10.1103/PhysRevB.93.045203 | Download: PDF | 2757 Cite : Bibtex RIS
M. Feneberg, J. Nixdorf, C. Lidig, R. Goldhahn, Z. Galazka, O. Bierwagen, and J.S. Speck

39 Author A. Papadogianni , M.E. White , J.S.Speck , Z. Galazka , O. Bierwagen
Title

Hall and Seebeck measurements estimate the thickness of a (buried) carrier system: Identifying interface electrons in In-doped SnO2 films

Source Appl. Phys. Lett. , 107 , 252105 ( 2015 )
DOI : 10.1063/1.4938471 | Download: PDF | 2756 Cite : Bibtex RIS
A. Papadogianni, M.E. White, J.S.Speck, Z. Galazka, and O. Bierwagen

40 Author J. Rombach , O. Bierwagen , A. Papadogianni , M. Mischo , V. Cimalla , T. Berthold , S. Krischok , M. Himmerlich
Title

Electrical Conductivity and Gas-sensing Properties of Mg-doped and Undoped Single-crystalline In2O3 Thin Films: Bulk vs. Surface

Source Procedia Eng. , 120 , 79 ( 2015 )
DOI : 10.1016/j.proeng.2015.08.570 | 2751 Cite : Bibtex RIS
J. Rombach, O. Bierwagen, A. Papadogianni, M. Mischo, V. Cimalla, T. Berthold, S. Krischok, and M. Himmerlich

Contact

Dr. Achim Trampert

Head of Department 

+49 30 20377-280

trampert@pdi-berlin.de