Nanoanalytics

The nanofabrication and nanoscience at the PDI requires dedicated analytical in-situ and ex-situ characterization techniques with high spatial resolution and sensitivity.

In-situ reflection high-energy electron diffraction is used to monitor the growth process during MBE and to control the growth on the atomic scale.

In addition, in-situ x-ray diffraction with synchrotron radiation (PHARAO project group at BESSY) is carried out to investigate surfaces and, in particular, interfaces of epitaxial layers during growth and in real time.

Furthermore, local spectroscopy on individual atomic clusters and molecules is performed in-situ by low-temperature scanning tunneling microscopy.

In addition, ex-situ high-resolution x-ray diffraction is routinely used to characterize the structure of as-grown materials.

Transmission electron microscopy methods including high-resolution imaging, electron diffraction, and electron energy-loss spectroscopy are applied to study the structural and chemical properties of individual units, ensembles of nanostructured materials, and their interfaces. In parallel, scanning electron microscopy in combination with cathodoluminescence spectroscopy and imaging probe the local optical properties. The research is strategically and operatively integrated in the other core research areas.

It presently concentrates on two main directions: the PHARAO project for in-situ growth studies and dedicated electron microscopy techniques for spatially resolved analysis.