Synchrotron studies
In situ synchrotron x-ray diffraction for non-destructive analysis of crystal growth
The research at PHARAO centers around the in situ analysis of fundamental growth processes in MBE. X-ray diffraction as a non-destructive probe can penetrate fairly thick layers and therefore allows us to study surfaces, interfaces and structures inside the volume of the crystal. As a diffraction technique, it combines sub-angstrom spatial resolution with a large interaction volume that provides statistically reliable material properties. Since unrestricted growth is possible during diffraction, we can follow interfaces during the entire process of their formation.
We focus on the study of epitaxial growth modes, the structural analysis of surfaces, interfaces and complete layer stacks, phase transitions and phenomena associated with extreme heteroepitaxy, the combination of very dissimilar materials.
