Microstructure

The department conducts fundamental and applied research on the scientific understanding of structural, chemical and mechanical properties of low-dimensional semiconductors, heterostructures, metastable materials and ferromagnet-semiconductor hybrid structures.

X-ray and electron diffraction, imaging and spectroscopy techniques including scanning tunneling microscopy are applied with high spatial resolution and sensitivity to analyze the material systems on different length scales up to the atomic resolution. Experimental results are compared with computer simulations and encouraged by theoretical modeling.