X-ray diffraction

The x-ray diffraction laboratory consists of two triple crystal diffractometers for high-resolution measurements. The four circle Panalytical X´Pert diffractometer (see figure) has an x-ray optics consisting of a multilayer mirror and a two-bounce Ge channel cut crystal optimized for high intensity of the incident beam. High quality epitaxial films can be measured rather quickly in the double crystal mode. In addition a three bounce channel cut Ge analyzer crystal can be inserted into the diffracted beam for reciprocal space mapping. The older four circle Bede D3 diffractometer uses a usual Bartels type monochromator near the point source of a Cu Ka x-ray tube, i.e. the arrangement realizes a highly monochromatic incident beam. A Si channel cut analyzer crystal is available at this diffractometer.