PDI -> Staff ->

Dr. Vladimir Kaganer

Senior Scientist

Project Leader

Vladimir Kaganer

phone: +49 30 20377 486

room: 0520

email: kaganer@pdi-berlin.de

 

Department: Microstructure

Core research areas: Nanoanalytics , III-V nanowires for optoelectronics

 

 

21 Author O. Brandt , S. Fernández-Garrido , J. K. Zettler , E. Luna , U. Jahn , C. Chèze , V. M. Kaganer
Title

Statistical analysis of the shape of one-dimensional nanostructures: determining the coalescence degree of spontaneously formed GaN nanowires

Source Cryst. Growth Des. , 14 , 2246 ( 2014 )
DOI : 10.1021/cg401838q | 2554 Cite : Bibtex RIS
O. Brandt, S. Fernández-Garrido, J. K. Zettler, E. Luna, U. Jahn, C. Chèze, and V. M. Kaganer

22 Author V. S. Kopp , V. M. Kaganer , M. V. Baidakova , W. V. Lundin , A. E. Nikolaev , E. V. Verkhovtceva , M. A. Yagovkina , N. Cherkashin
Title

X-ray determination of threading dislocation densities in GaN/Al2O3(0001) films grown by metalorganic vapor phase epitaxy

Source J. Appl. Phys. , 115 , 073507 ( 2014 )
DOI : 10.1063/1.4865502 | Download: PDF | 2549 Cite : Bibtex RIS
V. S. Kopp, V. M. Kaganer, M. V. Baidakova, W. V. Lundin, A. E. Nikolaev, E. V. Verkhovtceva, M. A. Yagovkina, and N. Cherkashin

23 Author V. S. Kopp , V. M. Kaganer , B. Jenichen , O. Brandt
Title

Analysis of reciprocal space maps of GaN(0001) films grown by molecular beam epitaxy

Source J. Appl. Cryst. , 47 , 256 ( 2014 )
DOI : 10.1107/S1600576713032639 | 2528 Cite : Bibtex RIS
V. S. Kopp, V. M. Kaganer, B. Jenichen, and O. Brandt

24 Author K. K. Sabelfeld , V. M. Kaganer , F. Limbach , P. Dogan , O. Brandt , L. Geelhaar , H. Riechert
Title

Height self-equilibration during the growth of dense nanowire ensembles: Order emerging from disorder

Source Appl. Phys. Lett. , 103 , 133105 ( 2013 )
Download: PDF | 2373 Cite : Bibtex RIS
K. K. Sabelfeld, V. M. Kaganer, F. Limbach, P. Dogan, O. Brandt, L. Geelhaar, and H. Riechert

25 Author M. Wölz , M. Ramsteiner , V. M. Kaganer , O. Brandt , L. Geelhaar , H. Riechert
Title

Strain engineering of nanowire multi-quantum wells demonstrated by Raman spectroscopy

Source Nano Lett. , 13 , 4053 ( 2013 )
2407 Cite : Bibtex RIS
M. Wölz, M. Ramsteiner, V. M. Kaganer, O. Brandt, L. Geelhaar, and H. Riechert

26 Author S. Fernández-Garrido , V. M. Kaganer , K. K. Sabelfeld , T. Gotschke , J. Grandal , E. Calleja , L. Geelhaar , O. Brandt
Title

Self-regulated radius of spontaneously formed GaN nanowires in molecular beam epitaxy

Source Nano Lett. , 13 , 3274 ( 2013 )
2410 Cite : Bibtex RIS
S. Fernández-Garrido, V. M. Kaganer, K. K. Sabelfeld, T. Gotschke, J. Grandal, E. Calleja, L. Geelhaar, and O. Brandt

27 Author M. Wölz , J. Lähnemann , O. Brandt , V. M. Kaganer , M. Ramsteiner , C. Pfüller , C. Hauswald , C. N. Huang , L. Geelhaar , H. Riechert
Title

Correlation between In content and emission wavelength of InxGa1-xN/GaN nanowire heterostructures

Source Nanotechnol. , 23 , 455203 ( 2012 )
DOI : 10.1088/0957-4484/23/45/455203 | Download arXiv: 1210.7597 | 2317 Cite : Bibtex RIS
M. Wölz, J. Lähnemann, O. Brandt, V. M. Kaganer, M. Ramsteiner, C. Pfüller, C. Hauswald, C. N. Huang, L. Geelhaar, and H. Riechert

28 Author M. Hanke , V. M. Kaganer , O. Bierwagen , M. Niehle , A. Trampert
Title

Delayed crystallization of ultrathin Gd2O3 on Si(111) observed by in vivo x-ray diffraction

Source Nanoscale Res. Lett. , 7 , 203 ( 2012 )
Download: PDF | 2231 Cite : Bibtex RIS
M. Hanke, V. M. Kaganer, O. Bierwagen, M. Niehle, and A. Trampert

29 Author V. M. Kaganer , B. Jenichen , O. Brandt , S. Fernández-Garrido , P. Dogan , L. Geelhaar , H. Riechert
Title

Inhomogeneous strain in GaN nanowires determined from x-ray diffraction peak profiles

Source Phys. Rev. B , 86 , 115325 ( 2012 )
Download: PDF | 2337 Cite : Bibtex RIS
V. M. Kaganer, B. Jenichen, O. Brandt, S. Fernández-Garrido, P. Dogan, L. Geelhaar, and H. Riechert

30 Author V. S. Kopp , V. M. Kaganer , J. Schwarzkopf , F. Waidick , T. Remmele , A. Kwasniewski , M. Schmidbauer
Title

X-ray diffraction from nonperiodic layered structures with correlations: analytical calculation and experiment on mixed Aurivillius films

Source Acta Cryst. A , 68 , 148 ( 2012 )
2257 Cite : Bibtex RIS
V. S. Kopp, V. M. Kaganer, J. Schwarzkopf, F. Waidick, T. Remmele, A. Kwasniewski, and M. Schmidbauer