PDI -> Staff ->

Dr. Vladimir Kaganer

Senior Scientist

Vladimir Kaganer

phone: +49 30 20377 486

room: 0520

email: kaganer@pdi-berlin.de

 

Department: Microstructure

Core research areas: Nanoanalytics , III-V nanowires for optoelectronics

 

 

21 Author V. M. Kaganer , B. Jenichen , M. Ramsteiner , U. Jahn , C. Hauswald , F. Grosse , S. Fernández-Garrido , O. Brandt
Title

Quantitative evaluation of the broadening of x-ray diffraction, Raman, and photoluminescence lines by dislocation-induced strain in heteroepitaxial GaN films

Source J. Phys. D: Appl. Phys. , 48 , 385105 ( 2015 )
DOI : 10.1088/0022-3727/48/38/385105 | 2709 Cite : Bibtex RIS
V. M. Kaganer, B. Jenichen, M. Ramsteiner, U. Jahn, C. Hauswald, F. Grosse, S. Fernández-Garrido, and O. Brandt

22 Author K. K. Sabelfeld , O. Brandt , V. M. Kaganer
Title

Stochastic model for the fluctuation-limited reaction-diffusion kinetics in inhomogeneous media based on the nonlinear Smoluchowski equations

Source J. Math. Chem. , 53 , 651 ( 2015 )
DOI : 10.1007/s10910-014-0446-6 | 2683 Cite : Bibtex RIS
K. K. Sabelfeld, O. Brandt, and V. M. Kaganer

23 Author S. Fernández-Garrido , V. M. Kaganer , C. Hauswald , B. Jenichen , M. Ramsteiner , V. Consonni , L. Geelhaar , O. Brandt
Title

Correlation between the structural and optical properties of spontaneously formed GaN nanowires: A quantitative evaluation of the impact of nanowire coalescence

Source Nanotechnology , 25 , 455702 ( 2014 )
DOI : 10.1088/0957-4484/25/45/455702 | Download arXiv: 1409.3773 | 2589 Cite : Bibtex RIS
S. Fernández-Garrido, V. M. Kaganer, C. Hauswald, B. Jenichen, M. Ramsteiner, V. Consonni, L. Geelhaar, and O. Brandt

24 Author C. Hauswald , P. Corfdir , J. K. Zettler , V. M. Kaganer , K. K. Sabelfeld , S. Fernández-Garrido , T. Flissikowski , V. Consonni , T. Gotschke , H. T. Grahn , L. Geelhaar , O. Brandt
Title

Origin of the nonradiative decay of bound excitons in GaN nanowires

Source Phys. Rev. B , 90 , 165304 ( 2014 )
DOI : 10.1103/PhysRevB.90.165304 | Download: PDF | 2635 Cite : Bibtex RIS
C. Hauswald, P. Corfdir, J. K. Zettler, V. M. Kaganer, K. K. Sabelfeld, S. Fernández-Garrido, T. Flissikowski, V. Consonni, T. Gotschke, H. T. Grahn, L. Geelhaar, and O. Brandt

25 Author V. G. Kopp , V. M. Kaganer
Title

X-ray diffraction from hexagonal dislocation networks

Source Phil. Mag. , 94 , 3247 ( 2014 )
DOI : 10.1080/14786435.2014.956837 | 2588 Cite : Bibtex RIS
V. G. Kopp, and V. M. Kaganer

26 Author V. M. Kaganer , K. K. Sabelfeld
Title

Strain distributions and diffraction peak profiles from crystals with dislocations

Source Acta Cryst. A , 70 , 457 ( 2014 )
DOI : 10.1107/S2053273314011139 | 2545 Cite : Bibtex RIS
V. M. Kaganer, and K. K. Sabelfeld

27 Author A. Proessdorf , M. Niehle , M. Hanke , F. Grosse , V. M. Kaganer , O. Bierwagen , A. Trampert
Title

Epitaxial polymorphism of La2O3 on Si(111) studied by in situ x-ray diff raction

Source Appl. Phys. Lett. , 105 , 021601 ( 2014 )
DOI : 10.1063/1.4890107 | Download: PDF | 2581 Cite : Bibtex RIS
A. Proessdorf, M. Niehle, M. Hanke, F. Grosse, V. M. Kaganer, O. Bierwagen, and A. Trampert

28 Author O. Brandt , S. Fernández-Garrido , J. K. Zettler , E. Luna , U. Jahn , C. Chèze , V. M. Kaganer
Title

Statistical analysis of the shape of one-dimensional nanostructures: determining the coalescence degree of spontaneously formed GaN nanowires

Source Cryst. Growth Des. , 14 , 2246 ( 2014 )
DOI : 10.1021/cg401838q | 2554 Cite : Bibtex RIS
O. Brandt, S. Fernández-Garrido, J. K. Zettler, E. Luna, U. Jahn, C. Chèze, and V. M. Kaganer

29 Author V. S. Kopp , V. M. Kaganer , M. V. Baidakova , W. V. Lundin , A. E. Nikolaev , E. V. Verkhovtceva , M. A. Yagovkina , N. Cherkashin
Title

X-ray determination of threading dislocation densities in GaN/Al2O3(0001) films grown by metalorganic vapor phase epitaxy

Source J. Appl. Phys. , 115 , 073507 ( 2014 )
DOI : 10.1063/1.4865502 | Download: PDF | 2549 Cite : Bibtex RIS
V. S. Kopp, V. M. Kaganer, M. V. Baidakova, W. V. Lundin, A. E. Nikolaev, E. V. Verkhovtceva, M. A. Yagovkina, and N. Cherkashin

30 Author V. S. Kopp , V. M. Kaganer , B. Jenichen , O. Brandt
Title

Analysis of reciprocal space maps of GaN(0001) films grown by molecular beam epitaxy

Source J. Appl. Cryst. , 47 , 256 ( 2014 )
DOI : 10.1107/S1600576713032639 | 2528 Cite : Bibtex RIS
V. S. Kopp, V. M. Kaganer, B. Jenichen, and O. Brandt