Senior Scientist
phone: +49 30 20377 486
room: 0520
email: kaganer@pdi-berlin.de
Department: Microstructure
Core research areas: Nanoanalytics , III-V nanowires for optoelectronics
21 | Author | V. M. Kaganer , B. Jenichen , M. Ramsteiner , U. Jahn , C. Hauswald , F. Grosse , S. Fernández-Garrido , O. Brandt |
Title |
Quantitative evaluation of the broadening of x-ray diffraction, Raman, and photoluminescence lines by dislocation-induced strain in heteroepitaxial GaN films |
|
Source | J. Phys. D: Appl. Phys. , 48 , 385105 ( 2015 ) | |
DOI : 10.1088/0022-3727/48/38/385105 | Cite : Bibtex RIS |
22 | Author | K. K. Sabelfeld , O. Brandt , V. M. Kaganer |
Title |
Stochastic model for the fluctuation-limited reaction-diffusion kinetics in inhomogeneous media based on the nonlinear Smoluchowski equations |
|
Source | J. Math. Chem. , 53 , 651 ( 2015 ) | |
DOI : 10.1007/s10910-014-0446-6 | Cite : Bibtex RIS |
23 | Author | S. Fernández-Garrido , V. M. Kaganer , C. Hauswald , B. Jenichen , M. Ramsteiner , V. Consonni , L. Geelhaar , O. Brandt |
Title |
Correlation between the structural and optical properties of spontaneously formed GaN nanowires: A quantitative evaluation of the impact of nanowire coalescence |
|
Source | Nanotechnology , 25 , 455702 ( 2014 ) | |
DOI : 10.1088/0957-4484/25/45/455702 | Download arXiv: 1409.3773 | Cite : Bibtex RIS |
24 | Author | C. Hauswald , P. Corfdir , J. K. Zettler , V. M. Kaganer , K. K. Sabelfeld , S. Fernández-Garrido , T. Flissikowski , V. Consonni , T. Gotschke , H. T. Grahn , L. Geelhaar , O. Brandt |
Title |
Origin of the nonradiative decay of bound excitons in GaN nanowires |
|
Source | Phys. Rev. B , 90 , 165304 ( 2014 ) | |
DOI : 10.1103/PhysRevB.90.165304 | Download: PDF | Cite : Bibtex RIS |
25 | Author | V. G. Kopp , V. M. Kaganer |
Title |
X-ray diffraction from hexagonal dislocation networks |
|
Source | Phil. Mag. , 94 , 3247 ( 2014 ) | |
DOI : 10.1080/14786435.2014.956837 | Cite : Bibtex RIS |
26 | Author | V. M. Kaganer , K. K. Sabelfeld |
Title |
Strain distributions and diffraction peak profiles from crystals with dislocations |
|
Source | Acta Cryst. A , 70 , 457 ( 2014 ) | |
DOI : 10.1107/S2053273314011139 | Cite : Bibtex RIS |
27 | Author | A. Proessdorf , M. Niehle , M. Hanke , F. Grosse , V. M. Kaganer , O. Bierwagen , A. Trampert |
Title |
Epitaxial polymorphism of La2O3 on Si(111) studied by in situ x-ray diffraction |
|
Source | Appl. Phys. Lett. , 105 , 021601 ( 2014 ) | |
DOI : 10.1063/1.4890107 | Download: PDF | Cite : Bibtex RIS |
28 | Author | O. Brandt , S. Fernández-Garrido , J. K. Zettler , E. Luna , U. Jahn , C. Chèze , V. M. Kaganer |
Title |
Statistical analysis of the shape of one-dimensional nanostructures: determining the coalescence degree of spontaneously formed GaN nanowires |
|
Source | Cryst. Growth Des. , 14 , 2246 ( 2014 ) | |
DOI : 10.1021/cg401838q | Cite : Bibtex RIS |
29 | Author | V. S. Kopp , V. M. Kaganer , M. V. Baidakova , W. V. Lundin , A. E. Nikolaev , E. V. Verkhovtceva , M. A. Yagovkina , N. Cherkashin |
Title |
X-ray determination of threading dislocation densities in GaN/Al2O3(0001) films grown by metalorganic vapor phase epitaxy |
|
Source | J. Appl. Phys. , 115 , 073507 ( 2014 ) | |
DOI : 10.1063/1.4865502 | Download: PDF | Cite : Bibtex RIS |
30 | Author | V. S. Kopp , V. M. Kaganer , B. Jenichen , O. Brandt |
Title |
Analysis of reciprocal space maps of GaN(0001) films grown by molecular beam epitaxy |
|
Source | J. Appl. Cryst. , 47 , 256 ( 2014 ) | |
DOI : 10.1107/S1600576713032639 | Cite : Bibtex RIS |