Dr. Vladimir Kaganer

X-ray diffraction from nonperiodic layered structures with correlations: analytical calculation and experiment on mixed Aurivillius films

@article{ author = { V. S. Kopp and V. M. Kaganer and J. Schwarzkopf and F. Waidick and T. Remmele and A. Kwasniewski and M. Schmidbauer }, title = { X-ray diffraction from nonperiodic layered structures with correlations: analytical calculation and experiment on mixed Aurivillius films }, journal = { Acta Crystallographica A }, volume = { 68 }, year = { 2012 }, pages = { 148 } }

TY - JOUR AU - V. S. Kopp AU - V. M. Kaganer AU - J. Schwarzkopf AU - F. Waidick AU - T. Remmele AU - A. Kwasniewski AU - M. Schmidbauer TI - X-ray diffraction from nonperiodic layered structures with correlations: analytical calculation and experiment on mixed Aurivillius films JF - Acta Crystallographica A JA - Acta Cryst. A J1 - VL - 68 SP - 148 PY - 2012/01/01

Strain and x-ray diffraction from axial nanowire heterostructures

@article{ author = { V. M. Kaganer and A. Yu. Belov }, title = { Strain and x-ray diffraction from axial nanowire heterostructures }, journal = { Physical Review B: Solid State }, volume = { 85 }, year = { 2012 }, pages = { 125402 } }

TY - JOUR AU - V. M. Kaganer AU - A. Yu. Belov TI - Strain and x-ray diffraction from axial nanowire heterostructures JF - Physical Review B: Solid State JA - Phys. Rev. B J1 - VL - 85 SP - 125402 PY - 2012/01/01

Structural properties of InN films grown on O-face ZnO(000|1) by plasma-assisted molecular beam epitaxy

@article{ author = { Y. J. Cho and O. Brandt and M. Korytov and M. Albrecht and V. M. Kaganer and M. Ramsteiner and H. Riechert }, title = { Structural properties of InN films grown on O-face ZnO(000|1) by plasma-assisted molecular beam epitaxy }, journal = { Applied Physics Letters }, volume = { 100 }, year = { 2012 }, pages = { 152105 } }

TY - JOUR AU - Y. J. Cho AU - O. Brandt AU - M. Korytov AU - M. Albrecht AU - V. M. Kaganer AU - M. Ramsteiner AU - H. Riechert TI - Structural properties of InN films grown on O-face ZnO(000|1) by plasma-assisted molecular beam epitaxy JF - Applied Physics Letters JA - Appl. Phys. Lett. J1 - APL VL - 100 SP - 152105 PY - 2012/01/01

X-ray diffraction study of plastic relaxation in Ge-rich SiGe virtual substrates

@article{ author = { V. S. Kopp and V. M. Kaganer and G. Capellini and M. De Seta and P. Zaumseil }, title = { X-ray diffraction study of plastic relaxation in Ge-rich SiGe virtual substrates }, journal = { Physical Review B: Solid State }, volume = { 85 }, year = { 2012 }, pages = { 245311 } }

TY - JOUR AU - V. S. Kopp AU - V. M. Kaganer AU - G. Capellini AU - M. De Seta AU - P. Zaumseil TI - X-ray diffraction study of plastic relaxation in Ge-rich SiGe virtual substrates JF - Physical Review B: Solid State JA - Phys. Rev. B J1 - VL - 85 SP - 245311 PY - 2012/01/01

Erratum: “Analyzing the growth of In_xGa_1-xN/GaN superlattices in selfinduced GaN nanowires by x-ray diffraction” [Appl. Phys. Lett. 98, 261907 (2011)]

@article{ author = { M. Wölz and V. M. Kaganer and O. Brandt and L. Geelhaar and H. Riechert }, title = { Erratum: “Analyzing the growth of In_xGa_1-xN/GaN superlattices in selfinduced GaN nanowires by x-ray diffraction” [Appl. Phys. Lett. 98, 261907 (2011)] }, journal = { Applied Physics Letters }, volume = { 100 }, year = { 2012 }, pages = { 179902 } }

TY - JOUR AU - M. Wölz AU - V. M. Kaganer AU - O. Brandt AU - L. Geelhaar AU - H. Riechert TI - Erratum: “Analyzing the growth of In_xGa_1-xN/GaN superlattices in selfinduced GaN nanowires by x-ray diffraction” [Appl. Phys. Lett. 98, 261907 (2011)] JF - Applied Physics Letters JA - Appl. Phys. Lett. J1 - APL VL - 100 SP - 179902 PY - 2012/01/01

Short range correlations of misfit dislocations in the x-ray diffraction peaks

@article{ author = { V. M. Kaganer and K. K. Sabelfeld }, title = { Short range correlations of misfit dislocations in the x-ray diffraction peaks }, journal = { Physica Status Solidi A }, volume = { 208 }, year = { 2011 }, pages = { 2563 } }

TY - JOUR AU - V. M. Kaganer AU - K. K. Sabelfeld TI - Short range correlations of misfit dislocations in the x-ray diffraction peaks JF - Physica Status Solidi A JA - Phys. Status Solidi A J1 - PSSA VL - 208 SP - 2563 PY - 2011/01/01

Analyzing the growth of In_xGa_1-xN/GaN superlattices in self-induced GaN nanowires by x-ray diffraction

@article{ author = { M. Wölz and V. M. Kaganer and O. Brandt and L. Geelhaar and H. Riechert }, title = { Analyzing the growth of In_xGa_1-xN/GaN superlattices in self-induced GaN nanowires by x-ray diffraction }, journal = { Applied Physics Letters }, volume = { 98 }, year = { 2011 }, pages = { 261907 } }

TY - JOUR AU - M. Wölz AU - V. M. Kaganer AU - O. Brandt AU - L. Geelhaar AU - H. Riechert TI - Analyzing the growth of In_xGa_1-xN/GaN superlattices in self-induced GaN nanowires by x-ray diffraction JF - Applied Physics Letters JA - Appl. Phys. Lett. J1 - APL VL - 98 SP - 261907 PY - 2011/01/01

X-ray diffraction profiles from axial nanowire heterostructures

@article{ author = { V. M. Kaganer and M. Wölz and O. Brandt and L. Geelhaar and H. Riechert }, title = { X-ray diffraction profiles from axial nanowire heterostructures }, journal = { Physical Review B: Solid State }, volume = { 83 }, year = { 2011 }, pages = { 245321 } }

TY - JOUR AU - V. M. Kaganer AU - M. Wölz AU - O. Brandt AU - L. Geelhaar AU - H. Riechert TI - X-ray diffraction profiles from axial nanowire heterostructures JF - Physical Review B: Solid State JA - Phys. Rev. B J1 - VL - 83 SP - 245321 PY - 2011/01/01

Concentration and relaxation depth profiles of In_xGa_1-xAs/GaAs and GaAs_1-xP_x/GaAs graded epitaxial films studied by x-ray diffraction

@article{ author = { A. Benediktovitch and A. Ulyanenkov and F. Rinaldi and K. Saito and V. M. Kaganer }, title = { Concentration and relaxation depth profiles of In_xGa_1-xAs/GaAs and GaAs_1-xP_x/GaAs graded epitaxial films studied by x-ray diffraction }, journal = { Physical Review B: Solid State }, volume = { 84 }, year = { 2011 }, pages = { 035302 } }

TY - JOUR AU - A. Benediktovitch AU - A. Ulyanenkov AU - F. Rinaldi AU - K. Saito AU - V. M. Kaganer TI - Concentration and relaxation depth profiles of In_xGa_1-xAs/GaAs and GaAs_1-xP_x/GaAs graded epitaxial films studied by x-ray diffraction JF - Physical Review B: Solid State JA - Phys. Rev. B J1 - VL - 84 SP - 035302 PY - 2011/01/01

Growth and structural characterization of epitaxial (La_1-xLu_x)₂O₃ layers grown on Si(111)

@article{ author = { T. Watahiki and F. Grosse and V. M. Kaganer and A. Proessdorf and W. Braun }, title = { Growth and structural characterization of epitaxial (La_1-xLu_x)₂O₃ layers grown on Si(111) }, journal = { Journal of Vacuum Science and Technology B }, volume = { 28 }, year = { 2010 }, pages = { C3A5 } }

TY - JOUR AU - T. Watahiki AU - F. Grosse AU - V. M. Kaganer AU - A. Proessdorf AU - W. Braun TI - Growth and structural characterization of epitaxial (La_1-xLu_x)₂O₃ layers grown on Si(111) JF - Journal of Vacuum Science and Technology B JA - J. Vac. Sci. Technol. B J1 - JVSTB VL - 28 SP - C3A5 PY - 2010/01/01