Senior Scientist
phone: +49 30 20377 486
room: 0520
email: kaganer@pdi-berlin.de
Department: Microstructure
Core research areas: Nanoanalytics , III-V nanowires for optoelectronics
31 | Author | K. K. Sabelfeld , V. M. Kaganer , F. Limbach , P. Dogan , O. Brandt , L. Geelhaar , H. Riechert |
Title |
Height self-equilibration during the growth of dense nanowire ensembles: Order emerging from disorder |
|
Source | Appl. Phys. Lett. , 103 , 133105 ( 2013 ) | |
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32 | Author | M. Wölz , M. Ramsteiner , V. M. Kaganer , O. Brandt , L. Geelhaar , H. Riechert |
Title |
Strain engineering of nanowire multi-quantum wells demonstrated by Raman spectroscopy |
|
Source | Nano Lett. , 13 , 4053 ( 2013 ) | |
Bibtex RIS | Cite :
33 | Author | S. Fernández-Garrido , V. M. Kaganer , K. K. Sabelfeld , T. Gotschke , J. Grandal , E. Calleja , L. Geelhaar , O. Brandt |
Title |
Self-regulated radius of spontaneously formed GaN nanowires in molecular beam epitaxy |
|
Source | Nano Lett. , 13 , 3274 ( 2013 ) | |
Bibtex RIS | Cite :
34 | Author | M. Wölz , J. Lähnemann , O. Brandt , V. M. Kaganer , M. Ramsteiner , C. Pfüller , C. Hauswald , C. N. Huang , L. Geelhaar , H. Riechert |
Title |
Correlation between In content and emission wavelength of InxGa1-xN/GaN nanowire heterostructures |
|
Source | Nanotechnology , 23 , 455203 ( 2012 ) | |
DOI : 10.1088/0957-4484/23/45/455203 | Download arXiv: 1210.7597 | Cite : Bibtex RIS |
35 | Author | M. Hanke , V. M. Kaganer , O. Bierwagen , M. Niehle , A. Trampert |
Title |
Delayed crystallization of ultrathin Gd2O3 on Si(111) observed by in vivo x-ray diffraction |
|
Source | Nanoscale Res. Lett. , 7 , 203 ( 2012 ) | |
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36 | Author | V. M. Kaganer , B. Jenichen , O. Brandt , S. Fernández-Garrido , P. Dogan , L. Geelhaar , H. Riechert |
Title |
Inhomogeneous strain in GaN nanowires determined from x-ray diffraction peak profiles |
|
Source | Phys. Rev. B , 86 , 115325 ( 2012 ) | |
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37 | Author | V. S. Kopp , V. M. Kaganer , J. Schwarzkopf , F. Waidick , T. Remmele , A. Kwasniewski , M. Schmidbauer |
Title |
X-ray diffraction from nonperiodic layered structures with correlations: analytical calculation and experiment on mixed Aurivillius films |
|
Source | Acta Cryst. A , 68 , 148 ( 2012 ) | |
Bibtex RIS | Cite :
38 | Author | V. M. Kaganer , A. Yu. Belov |
Title |
Strain and x-ray diffraction from axial nanowire heterostructures |
|
Source | Phys. Rev. B , 85 , 125402 ( 2012 ) | |
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39 | Author | Y. J. Cho , O. Brandt , M. Korytov , M. Albrecht , V. M. Kaganer , M. Ramsteiner , H. Riechert |
Title |
Structural properties of InN films grown on O-face ZnO(000|1) by plasma-assisted molecular beam epitaxy |
|
Source | Appl. Phys. Lett. , 100 , 152105 ( 2012 ) | |
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40 | Author | V. S. Kopp , V. M. Kaganer , G. Capellini , M. De Seta , P. Zaumseil |
Title |
X-ray diffraction study of plastic relaxation in Ge-rich SiGe virtual substrates |
|
Source | Phys. Rev. B , 85 , 245311 ( 2012 ) | |
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