Senior Scientist
phone: +49 30 20377 486
room: 0520
email: kaganer@pdi-berlin.de
Department: Microstructure
Core research areas: Nanoanalytics , III-V nanowires for optoelectronics
61 | Author | A. Shalimov , J. Bak-Misiuk , V. M. Kaganer , M. Calamiotou , A. Georgakilas |
Title |
Strain nonuniformity in GaAs heteroepitaxial films on Si (001) studied by x-ray diffraction |
|
Source | J. Appl. Phys. , 101 , 013517 ( 2007 ) | |
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62 | Author | V. M. Kaganer |
Title |
Crystal truncation rods in kinematical and dynamical x-ray diffraction theories |
|
Source | Phys. Rev. B , 75 , 245425 ( 2007 ) | |
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63 | Author | J. Herfort , B. Jenichen , V. M. Kaganer , A. Trampert , H.-P. Schönherr , K. H. Ploog |
Title |
Epitaxial Heusler alloy Fe3Si films on GaAs(001) substrates |
|
Source | Physica E (Amsterdam) , 32 , 371 ( 2006 ) | |
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64 | Author | V. M. Kaganer , A. Shalimov , J. Bak-Misiuk , K. H. Ploog |
Title |
X-ray diffraction peaks at glancing incidence and glancing exit from highly mismatched epitaxial layers |
|
Source | Appl. Phys. Lett. , 89 , 021922 ( 2006 ) | |
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65 | Author | V. M. Kaganer , A. Shalimov , J. Bak-Misiuk , K. H. Ploog |
Title |
Asymptotic x-ray scattering from highly mismatched epitaxial films |
|
Source | J. Phys.: Condens. Matter , 18 , 5047 ( 2006 ) | |
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66 | Author | V. M. Kaganer , K. H. Ploog , K. K. Sabelfeld |
Title |
Coarsening of facetted two-dimensional islands by dynamic coalescence |
|
Source | Phys. Rev. B , 73 , 115425 ( 2006 ) | |
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67 | Author | X. Guo , W. Braun , B. Jenichen , V. M. Kaganer , B. P. Tinkham , A. Trampert , K. H. Ploog |
Title |
Synchrotron x-ray scattering study of thin epitaxial Pr2O3 films on Si(001) |
|
Source | J. Appl. Phys. , 100 , 023536 ( 2006 ) | |
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68 | Author | V. M. Kaganer , O. Brandt , A. Trampert , K. H. Ploog |
Title |
X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films |
|
Source | Phys. Rev. B , 72 , 045423 ( 2005 ) | |
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69 | Author | W. Braun , V. M. Kaganer , B. Jenichen , B. Tinkham , K. H. Ploog |
Title |
Surface dynamics of III-V semiconductors studied by in situ x-ray diffraction during molecular beam epitaxy |
|
Source | Z. Kristallogr. , 220 , 225 ( 2005 ) | |
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70 | Author | V. M. Kaganer , W. Braun , B. Jenichen , K. H. Ploog |
Title |
Recovery kinetics of the GaAs(001) surface in molecular beam epitaxy studied by in situ x-ray diffraction |
|
Source | Physica B , 357 , 165 ( 2005 ) | |
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