Introduction to X-ray diffraction

Dr. Vladimir Kaganer is a Senior Scientist working on the theory of X-ray diffraction at PDI. 

After studying theoretical physics at the Moscow Engineering Physics Institute (1973-1979), Dr. Kaganer worked at the Theoretical Department of the Institute of Crystallography of the Russian Academy of Sciences on X-ray topography of dislocations and microdefects, obtaining a Ph.D. from the Institute in 1984. From 1995 to 1996 he was a visiting scientist at the "X-Ray Diffraction in Layered Structures" group of the Max Planck Society (Berlin), working on X-ray diffraction of misfit dislocations in epitaxial films. From 1996 to 1998 he was an Alexander von Humboldt Fellow at the Max Planck Institute for Colloids and Interfaces (Berlin), focusing on structure and phase transitions in Langmuir monolayers on the water surface. Since 1998 Dr. Kaganer has been a research associate at the Paul Drude Institute for Solid State Electronics (Berlin), where his research interests include X-ray diffraction from crystal lattice defects, X-ray diffraction during crystal growth, growth and structure of GaN nanowires.

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