Atomic Force Microscopy (AFM)
We operate three AFM systems that enable us to characterize the surface topography of our samples. Other scanning modes such as conductive AFM and Kelvin probe force microscopy are also available.
Beyond high resolution surface topography imaging, this system offers a wide range of scanning modes including conductive AFM, Kelvin probe force microscopy (KPFM), piezoresponse force microscopy (PFM), nanolithography, as well as scanning tunneling microscopy. Measurements are performed in air or in controlled atmosphere. Maximum sample size is around 1 cm × 1 cm.
This system enables measurements over large areas (6 inch in diameter) with capability of programmable multi-site measurements. Surface topography imaging can be obtained via tapping non-contact and contact modes. Other scanning modes are available including phase-contrast, adhesion, as well as magnetic force microscopy.
Similar to the Dimension Edge, this microscope also permits to scan over large areas (6 inch in diameter). In addition to topography modes, it is also equipped with KPFM and magnetic force microscopy.