In-situ X-Ray Diffraction
As part of PDI’s Core Research Area Nanoanalytics, and operating at the cross-section between the Microstructure Department and a recently-established Junior Research Group PHARAO combines in-situ x-ray diffraction and molecular beam epitaxy (MBE) in order to investigate epitaxial layers under most realistic conditions. Performed in-situ, under real growth conditions, and in real-time, research at the PHARAO beamline (BESSYII, Helmholtz-Zentrum Berlin) improves the understanding of fundamental growth processes.
Our work focuses on the study of epitaxial growth modes, structural analysis of interfaces and layer stacks, phase transitions, and phenomena associated with the combination of very dissimilar materials. The successful operation of such a setup critically depends on the continuous stationary operation of the MBE system at the synchrotron, since a high quality of the epitaxial layers is imperative for a reliable quantitative analysis.
