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Transmission Electron Microscopy

Our transmission electron microscope (TEM) setup can be used in a wide range of detection and imaging modes, e.g for direct imaging of the local atomic structure of materials.

Complementary attachments such as electron energy-loss spectroscopy energy dispersive x-ray spectroscopy and high-angle annular dark-field imaging complete the analytical performance of our microscopes in the field of chemical bonding, compositional imaging and two-dimensional mappings.