Transmission Electron Microscopy
Our transmission electron microscope (TEM) setup can be used in a wide range of detection and imaging modes, e.g for direct imaging of the local atomic structure of materials.
Complementary attachments such as electron energy-loss spectroscopy energy dispersive x-ray spectroscopy and high-angle annular dark-field imaging complete the analytical performance of our microscopes in the field of chemical bonding, compositional imaging and two-dimensional mappings.
