X-ray photoelectron spectroscopy (XPS)
Our Scienta-Omicron XPS system is used to analyse the elemental composition and chemical as well as electronic states at the surface of epitaxially grown materials.
The system is equipped with different components including x-ray (monochromatic) and ultraviolet sources, an ion sputtering gun (for compositional depth profiling), and a manipulator with heating and cooling capabilities. A customized load-lock chamber and UHV suitcase allow us to transfer samples from different MBE systems for XPS investigations without air exposure.
Equipment
- Argus Control Unit electron analyser
- Monochromated Al Kα X-ray source (photon energy=1486 eV)
- Focus ion gun (Ar+) for sample cleaning and depth profiling
- In-situ anneal samples inside the XPS main chamber up to 600°C
- Chiller: to cool the X-ray source during measurements
- Loadlock chamber: to load samples (max = 3) with possibility to outgas samples at temperature up to 200°C
- Possible to connect with a mobile chamber, which helps to transfer directly sample after MBE growth to XPS chamber to avoid oxidization.
Software
- MATRIX
- Vernissage
- CasaXPS