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Dr. Van Dong Pham

Scientist

+49 30 20377-261

pham@pdi-berlin.de

Microstructure

Room: 617

Core research areas

Nanoanalytics , 2D Materials

Publications

  1. Title

    Strain-induced reconstruction in two-dimensional silver intercalated between graphene and SiC

    Author
    V. D. Pham, B. Zheng, A. Jain, C. Dong, L.-S. Lu, Z. W. Henshaw, W. H. Blades, J. A. Robinson, V. H. Crespi, A. Trampert, R. Engel-Herbert
    Source
    Phys. Rev. Mater., 10, 034003 (2026)
    DOI:
    10.1103/pc8w-hz4t (PDI-ID: 3154)
  2. Title

    Point defects and their dynamic behaviors in silver monolayer intercalated between graphene and SiC

    Author
    V. D. Pham, A. Jain, C. Dong, L.-S. Lu, J. A. Robinson, A. Trampert, R. Engel-Herbert
    Source
    Nano Lett., 26, 2, 5c05763 (2025)
    DOI:
    10.1021/acs.nanolett.5c05763 (PDI-ID: 3139)
  3. Title

    Scanning tunneling microscopy of ultrathin indium intercalated between graphene and SiC using confinement heteroepitaxy

    Author
    V. D. Pham, C. González, Y. J. Dappe, C. Dong, J. A. Robinson, A. Trampert, R. Engel-Herbert
    Source
    Appl. Phys. Lett., 125, 181602 (2024)
    DOI:
    10.1063/5.0223972 (PDI-ID: 3051)
  4. Title

    Topological boundary states in engineered quantum-dot molecules on the InAs(111)A surface: Odd numbers of quantum dots

    Author
    V. D. Pham, Y. Pan, S. C. Erwin, F. von Oppen, K. Kanisawa, S. Fölsch
    Source
    Phys. Rev. Research, 6, 033268 (2024)
    DOI:
    10.1103/PhysRevResearch.6.033268 (PDI-ID: 3006)
  5. Title

    Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy

    Author
    V. D. Pham, C. González, Y. J. Dappe, C. Dong, J. A. Robinson, A. Trampert, R. Engel-Herbert
    Source
    Carbon, 227, 119260 (2024)
    DOI:
    10.1016/j.carbon.2024.119260 (PDI-ID: 2982)