Nanoanalytics
As semiconductor technology continues to shrink device sizes, precise information on the structure and composition of low-dimensional systems and nanoscale devices becomes essential. The physical properties of these materials are often determined by atomic-scale features, making advanced characterization techniques crucial. This Core Research Area focuses on understanding the fundamental structure-property relationships of nanomaterials through high-sensitivity, high-resolution experimental and modeling tools.
This CReA aims to:
- Clarify the structure-property relationship in low-dimensional systems.
- Provide precise information on the structure, composition, and electronic properties of nanoscale materials.
- Develop and apply sophisticated experimental and modeling tools for atomic-scale materials analysis.
Key research areas include:
- Epitaxial interfaces and 2D layers: Investigating hetero-interfaces in three dimensions (BALET), interfaces in van der Waals systems, and extreme heteroepitaxy (PHARAO).
- Strain and defect characterization: Understanding strain relaxation mechanisms in anisotropic systems and displacement-induced deformation in 2D materials.
- Phase stability in epitaxial systems: Studying composition fluctuations, decomposition, and solid-state epitaxy processes.
- Artificial quantum structures: Engineering quantum materials, manipulating atomic interfaces, and tailoring electronic properties in cleaved heterostructures.
This research leverages PDI’s state-of-the-art signature labs and facilities, including Application Laboratory Electron Tomography (BALET), the PHARAO beamline (BESSYII, Helmholtz-Zentrum Berlin), and Low-Temperature Scanning Tunneling Microscopy (LT-STM), to push the limits of material characterization and manipulation.